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| Total Pages | : 0 |
| Release | : 1995 |
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| Author | : Florian Banhart |
| Publisher | : World Scientific |
| Total Pages | : 318 |
| Release | : 2008-07-29 |
| Genre | : Technology & Engineering |
| ISBN | : 9814471461 |
In-situ high-resolution electron microscopy is a modern and powerful technique in materials research, physics, and chemistry. In-situ techniques are hardly treated in textbooks of electron microscopy. Thus, there is a need to collect the present knowledge about the techniques and achievements of in-situ electron microscopy in one book. Since high-resolution electron microscopes are available in most modern laboratories of materials science, more and more scientists or students are starting to work on this subject.In this comprehensive volume, the most important techniques and achievements of in-situ high-resolution electron microscopy will be reviewed by renowned experts. Applications in several fields of materials science will also be demonstrated.
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| Release | : 1995 |
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| Author | : Renu Sharma |
| Publisher | : |
| Total Pages | : 250 |
| Release | : 1996-08-26 |
| Genre | : Science |
| ISBN | : |
Electron microscopy techniques are among the most powerful methods for characterization of materials, with the ability to reveal both the atomic-scale structure and composition. This information may be used to elucidate macroscopic properties or to optimize materials synthesis and processing. Instrumentation and techniques for dynamic in situ experiments are undergoing rapid development and have recently been applied to a wide range of problems. This book focuses on time-resolved electron microscopy (including diffraction and spectroscopy), as well as novel instrumentation for temperature and pressure control. In addition to discussing the application of electron microscopy techniques to the in situ study of the kinetics, thermodynamics and mechanisms of reaction, the book also explores their utility as efficient methods of optimizing processing conditions. Imaging techniques featured include: scanning tunneling microscopy, high-resolution electron microscopy, dark field transmission and reflection electron microscopy, Lorentz microscopy, electron holography, scanning and low-energy electron microscopy and photoemission electron microscopy
| Author | : Ron M. Anderson |
| Publisher | : |
| Total Pages | : 320 |
| Release | : 1997 |
| Genre | : Science |
| ISBN | : 9781558993846 |
Successful transmission electron microscopy (TEM) experimentation depends on many things, one being specimen preparation. Whereas TEM samples of bulk metallic or ceramic materials can be prepared in a straightforward manner, the need to examine nonbulk and/or other classes of materials creates a need for more specialized preparation methods. This book from MRS, the fourth in a successful series, pioneers novel methods or ways of characterizing the specimen preparation process. Contributions to the book are tutorial in nature, and therefore somewhat longer than usual. Papers cover both general and materials-specific specimen preparation methods. Metallic, polymer, plastic, semiconducting, ceramic and magnetic materials as found in bulk, thin-film, dispersed and powdered forms are discussed.
| Author | : Hiroshi Fujita |
| Publisher | : |
| Total Pages | : 576 |
| Release | : 1985 |
| Genre | : Crystals |
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| Author | : Gareth Thomas |
| Publisher | : Univ of California Press |
| Total Pages | : 1315 |
| Release | : 2024-03-29 |
| Genre | : Non-Classifiable |
| ISBN | : 0520323238 |
This title is part of UC Press's Voices Revived program, which commemorates University of California Press’s mission to seek out and cultivate the brightest minds and give them voice, reach, and impact. Drawing on a backlist dating to 1893, Voices Revived makes high-quality, peer-reviewed scholarship accessible once again using print-on-demand technology. This title was originally published in 1972.
| Author | : Klaus Wetzig |
| Publisher | : Wiley-VCH |
| Total Pages | : 252 |
| Release | : 1995-05-09 |
| Genre | : Science |
| ISBN | : |
The authors of this book give an instructive survey of the latest advancements in Scanning Electron Microscopy (SEM). During the last two decades there has been a new stage in the development of scanning electron microscopes as they are equipped with special devices for in situ investigations. Thus a "microlab" now exists inside the electron microscope. Different in situ sample treatments, based on mechanical, thermal and electrical effects, as well as on surface modification by radiation and environmental interaction processes, can be used to quantitatively study reactions at solid surfaces under well-defined external conditions. The objects under investigation can be of many kinds: engineering materials, electrical and magnetic materials (as used in microelectronics), products of technical and chemical industries, minerals, forensic objects, textiles, pharmaceutical, biological and archaeological specimens.
| Author | : DAISUKE Shindo |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 162 |
| Release | : 2013-04-17 |
| Genre | : Science |
| ISBN | : 4431669884 |
Analytical electron microscopy is one of the most powerful tools today for characterization of the advanced materials that support the nanotechnology of the twenty-first century. In this book the authors clearly explain both the basic principles and the latest developments in the field. In addition to a fundamental description of the inelastic scattering process, an explanation of the constituent hardware is provided. Standard quantitative analytical techniques employing electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy are also explained, along with elemental mapping techniques. Included are sections on convergent beam electron diffraction and electron holography utilizing the field emission gun. With generous use of illustrations and experimental data, this book is a valuable resource for anyone concerned with materials characterization, electron microscopy, materials science, crystallography, and instrumentation.
| Author | : David Bernard Williams |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 818 |
| Release | : 1996 |
| Genre | : Science |
| ISBN | : 9780306452475 |
This groundbreaking text provides the necessary instructions for hands-on application of this versatile materials characterization technique and is supported by over 600 illustrations and diagrams.
