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Advances in Electronic Testing

Advances in Electronic Testing
Author: Dimitris Gizopoulos
Publisher: Springer Science & Business Media
Total Pages: 431
Release: 2006-01-22
Genre: Technology & Engineering
ISBN: 0387294090
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This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.

Advances in Food Authenticity Testing

Advances in Food Authenticity Testing
Author: Gerard Downey
Publisher: Woodhead Publishing
Total Pages: 798
Release: 2016-08-22
Genre:
ISBN: 9780081002209
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"Advances in Food Authenticity Testing" covers a topic that is of great importance to both the food industry whose responsibility it is to provide clear and accurate labeling of their products and maintain food safety and the government agencies and organizations that are tasked with the verification of claims of food authenticity. The adulteration of foods with cheaper alternatives has a long history, but the analytical techniques which can be implemented to test for these are ever advancing. The book covers the wide range of methods and techniques utilized in the testing of food authenticity, including new implementations and processes. The first part of the book examines, in detail, the scientific basis and the process of how these techniques are used, while other sections highlight specific examples of the use of these techniques in the testing of various foods. Written by experts in both academia and industry, the book provides the most up-to-date and comprehensive coverage of this important and rapidly progressing field. Covers a topic that is of great importance to both the food industry and the governmental agencies tasked with verifying the safety and authenticity of food productsPresents a wide range of methods and techniques utilized in the testing of food authenticity, including new implementations and processesHighlights specific examples of the use of the emerging techniques and testing strategies for various foods

Introduction to Advanced System-on-Chip Test Design and Optimization

Introduction to Advanced System-on-Chip Test Design and Optimization
Author: Erik Larsson
Publisher: Springer Science & Business Media
Total Pages: 397
Release: 2006-03-30
Genre: Technology & Engineering
ISBN: 0387256245
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SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.

Soft Errors in Modern Electronic Systems

Soft Errors in Modern Electronic Systems
Author: Michael Nicolaidis
Publisher: Springer Science & Business Media
Total Pages: 331
Release: 2010-09-24
Genre: Technology & Engineering
ISBN: 1441969934
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This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques. The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry experts in reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.

Principles of Testing Electronic Systems

Principles of Testing Electronic Systems
Author: Samiha Mourad
Publisher: John Wiley & Sons
Total Pages: 444
Release: 2000-07-25
Genre: Technology & Engineering
ISBN: 9780471319313
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A pragmatic approach to testing electronic systems As we move ahead in the electronic age, rapid changes in technology pose an ever-increasing number of challenges in testing electronic products. Many practicing engineers are involved in this arena, but few have a chance to study the field in a systematic way-learning takes place on the job. By covering the fundamental disciplines in detail, Principles of Testing Electronic Systems provides design engineers with the much-needed knowledge base. Divided into five major parts, this highly useful reference relates design and tests to the development of reliable electronic products; shows the main vehicles for design verification; examines designs that facilitate testing; and investigates how testing is applied to random logic, memories, FPGAs, and microprocessors. Finally, the last part offers coverage of advanced test solutions for today's very deep submicron designs. The authors take a phenomenological approach to the subject matter while providing readers with plenty of opportunities to explore the foundation in detail. Special features include: * An explanation of where a test belongs in the design flow * Detailed discussion of scan-path and ordering of scan-chains * BIST solutions for embedded logic and memory blocks * Test methodologies for FPGAs * A chapter on testing system on a chip * Numerous references

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
Author: M. Bushnell
Publisher: Springer Science & Business Media
Total Pages: 690
Release: 2006-04-11
Genre: Technology & Engineering
ISBN: 0306470403
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The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

Digital Circuit Testing

Digital Circuit Testing
Author: Francis C. Wong
Publisher: Elsevier
Total Pages: 248
Release: 2012-12-02
Genre: Technology & Engineering
ISBN: 0080504345
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Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.

Computer-Based Testing and the Internet

Computer-Based Testing and the Internet
Author: Dave Bartram
Publisher: John Wiley & Sons
Total Pages: 272
Release: 2005-09-27
Genre: Psychology
ISBN: 0470861932
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No topic is more central to innovation and current practice in testing and assessment today than computers and the Internet. This timely publication highlights four main themes that define current issues, technical advances and applications of computer-based testing: Advances in computer-based testing -- new test designs, item selection algorithms, exposure control issues and methods, and new tests that capitalize on the power of computer technology. Operational issues -- systems design, test security, and legal and ethical matters. New and improved uses -- for tests in employment and credentialing. The future of computer-based testing -- identifying potential issues, developments, major advances and problems to overcome. Written by internationally recognized contributors, each chapter focuses on issues of control, quality, security and technology. These issues provide the basic structure for the International Test Commission's new Guidelines on Computer-Based Testing and Testing on the Internet. The contributions to this book have played a key role in the development of these guidelines. Computer-Based Testing and the Internet is a comprehensive guide for all professionals, academics and practitioners working in the fields of education, credentialing, personnel testing and organizational assessment. It will also be of value to students developing expertise in these areas.

Introduction to Advanced System-on-Chip Test Design and Optimization

Introduction to Advanced System-on-Chip Test Design and Optimization
Author: Erik Larsson
Publisher: Springer
Total Pages: 0
Release: 2008-11-01
Genre: Technology & Engineering
ISBN: 9780387522791
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SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools. The book is divided into three sections: i) test concepts, ii) SOC design for test, and iii) SOC test applications. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process.

Next Generation Java Testing

Next Generation Java Testing
Author: Cédric Beust
Publisher: Pearson Education
Total Pages: 523
Release: 2007-10-15
Genre: Computers
ISBN: 0132702274
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Enterprise Java developers must achieve broader, deeper test coverage, going beyond unit testing to implement functional and integration testing with systematic acceptance. Next Generation JavaTM Testing introduces breakthrough Java testing techniques and TestNG, a powerful open source Java testing platform. Cédric Beust, TestNG's creator, and leading Java developer Hani Suleiman, present powerful, flexible testing patterns that will work with virtually any testing tool, framework, or language. They show how to leverage key Java platform improvements designed to facilitate effective testing, such as dependency injection and mock objects. They also thoroughly introduce TestNG, demonstrating how it overcomes the limitations of older frameworks and enables new techniques, making it far easier to test today's complex software systems. Pragmatic and results-focused, Next Generation JavaTM Testing will help Java developers build more robust code for today's mission-critical environments. This book Illuminates the tradeoffs associated with testing, so you can make better decisions about what and how to test Introduces TestNG, explains its goals and features, and shows how to apply them in real-world environments Shows how to integrate TestNG with your existing code, development frameworks, and software libraries Demonstrates how to test crucial code features, such as encapsulation, state sharing, scopes, and thread safety Shows how to test application elements, including JavaEE APIs, databases, Web pages, and XML files Presents advanced techniques: testing partial failures, factories, dependent testing, remote invocation, cluster-based test farms, and more Walks through installing and using TestNG plug-ins for Eclipse, and IDEA Contains extensive code examples Whether you use TestNG, JUnit, or another testing framework, the testing design patterns presented in this book will show you how to improve your tests by giving you concrete advice on how to make your code and your design more testable.