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| Author | : E. Sicard |
| Publisher | : |
| Total Pages | : 86 |
| Release | : 2004 |
| Genre | : Electromagnetic compatibility |
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| Author | : |
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| Total Pages | : 85 |
| Release | : 2004 |
| Genre | : Electromagnetic compatibility |
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| Author | : Étienne Sicard |
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| Total Pages | : 85 |
| Release | : 2004 |
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| Release | : 2022 |
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| ISBN | : 9781665423809 |
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| Release | : 2015 |
| Genre | : Electromagnetic compatibility |
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| Release | : 2019 |
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| ISBN | : 9781728142623 |
| Author | : IEEE Staff |
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| Total Pages | : |
| Release | : 2017-07-04 |
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| ISBN | : 9781538626900 |
Measurement and modeling of IC emissions and susceptibility, Signal Integrity and Power Integrity at IC and PCB level EMC aware IC Design and Guidelines, Tools to handle EMC at IC level Computational Electromagnetics for IC level EMC EMC issues in System on chip (SoC), System inPackage (SiP), and 3D ICs, EMC issues in smart power ICs EMC of ICs in wireless communications, EMC of ICs for biomedical applications, Materials for improved EMC of ICs, Harsh environment effects on IC level EMC, Long term electromagnetic robustness of ICs, Standards and regulations up to 6 GHz, Modern EMC education on IC level EMC, Influence of IC EMC on system design, Intentional Electromagnetic Interference
| Author | : IEEE Staff |
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| Release | : 2015-11-10 |
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| ISBN | : 9781467378987 |
The achievements in terms of operating frequency and integration of semiconductor technology are constantly creating new challenges in EMC, which must necessarily be addressed at both the integrated circuit and system level Keeping up to date is of paramount importance to be successful in this field The 10th International Workshop EMC Compo 2015 is intended to be a place for exchange of the latest research achievements and experience in IC level EMC and it is addressed to researchers and Engineers from industry and from academia The workshop is focused on emission and susceptibility issues in digital, analogue and mixed signal integrated circuits The most recent advances in simulation and measurement techniques, models, standards, tools and design methodologies will be discussed A Technical Exhibition will also be held James Clerk Maxwell was born in Edinburgh and there will be an opportunity for delegates to visit his birthplace, in recognition of 150 years of his equations
| Author | : IEEE Staff |
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| Release | : 2013-12-15 |
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| ISBN | : 9781479950041 |
The International Workshop EMC Compo 2013 is focused on emission and susceptibility as well as power and signal integrity issues of digital, analogue and mixed signal integrated circuits, simulation, measurement, and modeling techniques
| Author | : Sonia Ben Dhia |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 478 |
| Release | : 2006-06-04 |
| Genre | : Technology & Engineering |
| ISBN | : 0387266011 |
Electromagnetic Compatibility of Integrated Circuits: Techniques for Low Emission and Susceptibility focuses on the electromagnetic compatibility of integrated circuits. The basic concepts, theory, and an extensive historical review of integrated circuit emission and susceptibility are provided. Standardized measurement methods are detailed through various case studies. EMC models for the core, I/Os, supply network, and packaging are described with applications to conducted switching noise, signal integrity, near-field and radiated noise. Case studies from different companies and research laboratories are presented with in-depth descriptions of the ICs, test set-ups, and comparisons between measurements and simulations. Specific guidelines for achieving low emission and susceptibility derived from the experience of EMC experts are presented.
