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3D Stacked Memory

3D Stacked Memory
Author:
Publisher: LexInnova Technologies, LLC
Total Pages: 24
Release: 2015-04-01
Genre:
ISBN:

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Our report on 3D stacked memory technology covers the Intellectual Property (Patent) landscape of this rapidly evolving technology and monitors its various sub-domains for licensing activity. We have analyzed the IP portfolios of SanDisk, Micron, Samsung, IBM and other major players to find the focus areas of their patenting efforts. Using our proprietary patent analytics tool, LexScore™, we identify the front runners in this technology domain with strong patent portfolio quality as well as a heavy patent filing activity. Using our proprietary Licensing Heat-map framework, we also predict licensing activity trend in various technology sub domains.


Handbook of 3D Integration, Volume 4

Handbook of 3D Integration, Volume 4
Author: Paul D. Franzon
Publisher: John Wiley & Sons
Total Pages: 582
Release: 2019-01-25
Genre: Technology & Engineering
ISBN: 3527697063

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This fourth volume of the landmark handbook focuses on the design, testing, and thermal management of 3D-integrated circuits, both from a technological and materials science perspective. Edited and authored by key contributors from top research institutions and high-tech companies, the first part of the book provides an overview of the latest developments in 3D chip design, including challenges and opportunities. The second part focuses on the test methods used to assess the quality and reliability of the 3D-integrated circuits, while the third and final part deals with thermal management and advanced cooling technologies and their integration.


Vertical 3D Memory Technologies

Vertical 3D Memory Technologies
Author: Betty Prince
Publisher: John Wiley & Sons
Total Pages: 0
Release: 2014-10-06
Genre: Technology & Engineering
ISBN: 1118760514

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The large scale integration and planar scaling of individual system chips is reaching an expensive limit. If individual chips now, and later terrabyte memory blocks, memory macros, and processing cores, can be tightly linked in optimally designed and processed small footprint vertical stacks, then performance can be increased, power reduced and cost contained. This book reviews for the electronics industry engineer, professional and student the critical areas of development for 3D vertical memory chips including: gate-all-around and junction-less nanowire memories, stacked thin film and double gate memories, terrabit vertical channel and vertical gate stacked NAND flash, large scale stacking of Resistance RAM cross-point arrays, and 2.5D/3D stacking of memory and processor chips with through-silicon-via connections now and remote links later. Key features: Presents a review of the status and trends in 3-dimensional vertical memory chip technologies. Extensively reviews advanced vertical memory chip technology and development Explores technology process routes and 3D chip integration in a single reference


3D Stacked Chips

3D Stacked Chips
Author: Ibrahim (Abe) M. Elfadel
Publisher: Springer
Total Pages: 354
Release: 2016-05-11
Genre: Technology & Engineering
ISBN: 3319204815

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This book explains for readers how 3D chip stacks promise to increase the level of on-chip integration, and to design new heterogeneous semiconductor devices that combine chips of different integration technologies (incl. sensors) in a single package of the smallest possible size. The authors focus on heterogeneous 3D integration, addressing some of the most important challenges in this emerging technology, including contactless, optics-based, and carbon-nanotube-based 3D integration, as well as signal-integrity and thermal management issues in copper-based 3D integration. Coverage also includes the 3D heterogeneous integration of power sources, photonic devices, and non-volatile memories based on new materials systems.


Die-stacking Architecture

Die-stacking Architecture
Author: Yuan Xie
Publisher: Springer Nature
Total Pages: 113
Release: 2022-05-31
Genre: Technology & Engineering
ISBN: 3031017471

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The emerging three-dimensional (3D) chip architectures, with their intrinsic capability of reducing the wire length, promise attractive solutions to reduce the delay of interconnects in future microprocessors. 3D memory stacking enables much higher memory bandwidth for future chip-multiprocessor design, mitigating the "memory wall" problem. In addition, heterogenous integration enabled by 3D technology can also result in innovative designs for future microprocessors. This book first provides a brief introduction to this emerging technology, and then presents a variety of approaches to designing future 3D microprocessor systems, by leveraging the benefits of low latency, high bandwidth, and heterogeneous integration capability which are offered by 3D technology.


3D Stacked Memories for Digital Signal Processors

3D Stacked Memories for Digital Signal Processors
Author:
Publisher:
Total Pages: 97
Release: 2013
Genre:
ISBN:

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Recently, three-dimensional (3D) integration technology has enabled researchers to explore novel architectures. Due to the growing memory requirements of modern signal processing applications, it was thought that digital signal processors (DSPs) could benefit from 3D memory integration technology where high-density memories are placed below processing cores. Until recently, it was believed that this integration could lower memory latencies by 45% to 60%, which would improve performance. 3D memory integration technology also allowed a large increase in the main memory bus width by using small through silicon vias (TSVs) instead of off-chip metal wires. This increase in the bus width meant each main memory request could bring more data into the last-level on-chip memory and improve the performance of streaming applications whose memory access behavior exhibits a large amount of spatial locality. My dissertation provides a more accurate 3D main memory model that demonstrates that the latency reduction of going from conventional DDR2 DRAM to 3D memory technology is roughly 4% instead of the often quoted 45% to 60%. With this model, I re-evaluate the performance impact of 3D main memory on DSPs and find the benefits from the latency savings are small. I next analyze current 3D main memory with Wide I/O, which can lower main memory latencies by 15.9% and greatly increase the main memory bus width. I demonstrate that using 3D main memory with Wide I/O and increasing the main memory bus width from 64 bits to 4,096 bits can improve the average performance of signal processing applications by 9.7%, but also increases average energy consumption by 2.6%. For energy-constraint DSPs that are often found in mobile devices, this increase may be unacceptable. To mitigate this energy increase, I propose novel techniques to dynamically scale the main memory bus width of a DSP based on the program phases of an application. These bandwidth scaling algorithms increase the main memory bus width during memory intense phases to improve performance and lower the bus width during compute intensive phases to improve energy efficiency. These algorithms can improve average DSP performance by 6.6% while increasing average energy consumption by only 0.5%.


Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs

Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs
Author: Brandon Noia
Publisher: Springer Science & Business Media
Total Pages: 260
Release: 2013-11-19
Genre: Technology & Engineering
ISBN: 3319023780

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This book describes innovative techniques to address the testing needs of 3D stacked integrated circuits (ICs) that utilize through-silicon-vias (TSVs) as vertical interconnects. The authors identify the key challenges facing 3D IC testing and present results that have emerged from cutting-edge research in this domain. Coverage includes topics ranging from die-level wrappers, self-test circuits, and TSV probing to test-architecture design, test scheduling, and optimization. Readers will benefit from an in-depth look at test-technology solutions that are needed to make 3D ICs a reality and commercially viable.


Vertical 3D Memory Technologies

Vertical 3D Memory Technologies
Author: Betty Prince
Publisher: John Wiley & Sons
Total Pages: 466
Release: 2014-08-13
Genre: Technology & Engineering
ISBN: 1118760468

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The large scale integration and planar scaling of individual system chips is reaching an expensive limit. If individual chips now, and later terrabyte memory blocks, memory macros, and processing cores, can be tightly linked in optimally designed and processed small footprint vertical stacks, then performance can be increased, power reduced and cost contained. This book reviews for the electronics industry engineer, professional and student the critical areas of development for 3D vertical memory chips including: gate-all-around and junction-less nanowire memories, stacked thin film and double gate memories, terrabit vertical channel and vertical gate stacked NAND flash, large scale stacking of Resistance RAM cross-point arrays, and 2.5D/3D stacking of memory and processor chips with through-silicon-via connections now and remote links later. Key features: Presents a review of the status and trends in 3-dimensional vertical memory chip technologies. Extensively reviews advanced vertical memory chip technology and development Explores technology process routes and 3D chip integration in a single reference