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| Release | : 2016 |
| Genre | : Integrated circuits |
| ISBN | : 9781509036233 |
| Author | : IEEE Staff |
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| Release | : 2016-09-19 |
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| ISBN | : 9781509036240 |
DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI systems inclusive of emerging technologies One of the unique features of this symposium is to combine new academic research with state of the art industrial data, necessary ingredients for significant advances in this field All aspects of design, manufacturing, test, reliability, and availability that are affected by defects during manufacturing and by faults during system operation are of interest
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| Release | : 2016 |
| Genre | : Integrated circuits |
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Annotation DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI systems inclusive of emerging technologies One of the unique features of this symposium is to combine new academic research with state of the art industrial data, necessary ingredients for significant advances in this field All aspects of design, manufacturing, test, reliability, and availability that are affected by defects during manufacturing and by faults during system operation are of interest.
| Author | : IEEE Staff |
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| Release | : 2015-10-12 |
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| ISBN | : 9781479986316 |
DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI systems inclusive of emerging technologies One of the unique features of this symposium is to combine new academic research with state of the art industrial data, necessary ingredients for significant advances in this field All aspects of design, manufacturing, test, reliability, and availability that are affected by defects during manufacturing and by faults during system operation are of interest
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| Total Pages | : 236 |
| Release | : 2015 |
| Genre | : Integrated circuits |
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| Release | : 2013 |
| Genre | : Integrated circuits |
| ISBN | : 9781479915835 |
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| Total Pages | : 304 |
| Release | : 2014 |
| Genre | : Fault-tolerant computing |
| ISBN | : 9781479961559 |
| Author | : International Symposium on Defect and Fault Tolerance in VLSI Systems |
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| Release | : 2003 |
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| Release | : 2012 |
| Genre | : Fault-tolerant computing |
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| Publisher | : IEEE |
| Total Pages | : 422 |
| Release | : 2000 |
| Genre | : Computers |
| ISBN | : 9780769507194 |
This work constitutes the proceedings of the 2000 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2000). Subjects addressed include: yield analysis and modelling; wafer scale/large area systems; fault-tolerant systems; tesitng strategies; and more.
