2011 Ieee 20th Conference On Electrical Performance Of Electronic Packaging And Systems PDF Download

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EPEPS 2010

EPEPS 2010
Author:
Publisher:
Total Pages:
Release: 2010
Genre: Electronic packaging
ISBN: 9781424468669

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Leonove

Leonove
Author:
Publisher:
Total Pages:
Release: 1979
Genre:
ISBN:

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Advances in Embedded and Fan-Out Wafer Level Packaging Technologies

Advances in Embedded and Fan-Out Wafer Level Packaging Technologies
Author: Beth Keser
Publisher: John Wiley & Sons
Total Pages: 576
Release: 2019-02-12
Genre: Technology & Engineering
ISBN: 1119314135

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Examines the advantages of Embedded and FO-WLP technologies, potential application spaces, package structures available in the industry, process flows, and material challenges Embedded and fan-out wafer level packaging (FO-WLP) technologies have been developed across the industry over the past 15 years and have been in high volume manufacturing for nearly a decade. This book covers the advances that have been made in this new packaging technology and discusses the many benefits it provides to the electronic packaging industry and supply chain. It provides a compact overview of the major types of technologies offered in this field, on what is available, how it is processed, what is driving its development, and the pros and cons. Filled with contributions from some of the field's leading experts,Advances in Embedded and Fan-Out Wafer Level Packaging Technologies begins with a look at the history of the technology. It then goes on to examine the biggest technology and marketing trends. Other sections are dedicated to chip-first FO-WLP, chip-last FO-WLP, embedded die packaging, materials challenges, equipment challenges, and resulting technology fusions. Discusses specific company standards and their development results Content relates to practice as well as to contemporary and future challenges in electronics system integration and packaging Advances in Embedded and Fan-Out Wafer Level Packaging Technologies will appeal to microelectronic packaging engineers, managers, and decision makers working in OEMs, IDMs, IFMs, OSATs, silicon foundries, materials suppliers, equipment suppliers, and CAD tool suppliers. It is also an excellent book for professors and graduate students working in microelectronic packaging research.


Electrical Design of Through Silicon Via

Electrical Design of Through Silicon Via
Author: Manho Lee
Publisher: Springer
Total Pages: 286
Release: 2014-05-11
Genre: Technology & Engineering
ISBN: 9401790388

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Through Silicon Via (TSV) is a key technology for realizing three-dimensional integrated circuits (3D ICs) for future high-performance and low-power systems with small form factors. This book covers both qualitative and quantitative approaches to give insights of modeling TSV in a various viewpoints such as signal integrity, power integrity and thermal integrity. Most of the analysis in this book includes simulations, numerical modelings and measurements for verification. The author and co-authors in each chapter have studied deep into TSV for many years and the accumulated technical know-hows and tips for related subjects are comprehensively covered.


EPEPS 2020

EPEPS 2020
Author:
Publisher:
Total Pages:
Release: 2020
Genre: Electronic packaging
ISBN:

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