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| Author | : IEEE Staff |
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| Total Pages | : |
| Release | : 2010 |
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| ISBN | : 9781424455966 |
| Author | : |
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| Total Pages | : 364 |
| Release | : 2010 |
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| ISBN | : 9781424455973 |
| Author | : |
| Publisher | : ASM International |
| Total Pages | : 479 |
| Release | : 2011 |
| Genre | : Technology & Engineering |
| ISBN | : 1615038507 |
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| Publisher | : ASM International |
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| Release | : 2018-12-01 |
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| ISBN | : 1627080996 |
The International Symposium for Testing and Failure Analysis (ISTFA) 2018 is co-located with the International Test Conference (ITC) 2018, October 28 to November 1, in Phoenix, Arizona, USA at the Phoenix Convention Center. The theme for the November 2018 conference is "Failures Worth Analyzing." While technology advances fast and the market demands the latest and the greatest, successful companies strive to stay competitive and remain profitable.
| Author | : IEEE Singapore Section |
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| Total Pages | : |
| Release | : 1987 |
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| Author | : |
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| Total Pages | : 378 |
| Release | : 2005 |
| Genre | : Integrated circuits |
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| Author | : ASM International |
| Publisher | : ASM International |
| Total Pages | : 643 |
| Release | : 2012 |
| Genre | : Technology & Engineering |
| ISBN | : 1615039953 |
| Author | : A. S. M. International |
| Publisher | : ASM International |
| Total Pages | : 634 |
| Release | : 2013-01-01 |
| Genre | : Technology & Engineering |
| ISBN | : 1627080228 |
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures.
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| Author | : International Symposium on the Physical & Failure Analysis of Integrated Circuits |
| Publisher | : |
| Total Pages | : |
| Release | : 2003 |
| Genre | : Integrated circuits |
| ISBN | : 9780780377226 |
