1996 IEEE International Integrated Reliability Workshop Final Report
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Release | : 1997 |
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Release | : 1997 |
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Author | : IEEE, Electron Devices Society and Reliability Society Staff |
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Release | : 1997 |
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Author | : IEEE Electron Devices Society |
Publisher | : IEEE |
Total Pages | : 175 |
Release | : 1997 |
Genre | : Technology & Engineering |
ISBN | : 9780780335981 |
The International Integrated Reliability Workshop provides a forum for sharing new approaches to achieve and maintain microelectronic component reliability. The 1996 Final Report includes papers, abstracts, and summaries from the conference.
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Total Pages | : 0 |
Release | : 1996 |
Genre | : Integrated circuits |
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Total Pages | : 202 |
Release | : 2005 |
Genre | : Integrated circuits |
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Author | : International Integrated Reliability Workshop |
Publisher | : |
Total Pages | : 188 |
Release | : 1999 |
Genre | : Electronic book |
ISBN | : 9780780356498 |
Author | : IEEE Reliability Society |
Publisher | : IEEE |
Total Pages | : 140 |
Release | : 1998 |
Genre | : Technology & Engineering |
ISBN | : 9780780348813 |
The International Integrated Reliability Workshop provides a forum for sharing new approaches to achieve and maintain microelectronic component reliability. Topics include: contributors to failure; waver level reliability; building in reliability; and reliability test structures.
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Author | : IEEE Electron Devices Society |
Publisher | : IEEE |
Total Pages | : 188 |
Release | : 1999 |
Genre | : Technology & Engineering |
ISBN | : 9780780356498 |
This text constitutes the final report produced from the IEEE International Integrated Reliability Workshop, which took part in 1999.
Author | : James E. Vinson |
Publisher | : Springer Science & Business Media |
Total Pages | : 214 |
Release | : 2012-12-06 |
Genre | : Technology & Engineering |
ISBN | : 1461503213 |
Electrostatic Discharge is a pervasive issue in the semiconductor industry affecting both manufacturers and users of semiconductors. This easy-to-read, practical handbook presents an overview of ESD as it effects electronic circuits and provides a concise introduction for students, engineers, circuit designers and failure analysts.