1990 IEEE International Reliability Physics Symposium Proceedings
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Total Pages | : 322 |
Release | : 1990 |
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Download 1990 IEEE International Reliability Physics Symposium Proceedings Book in PDF, ePub and Kindle
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Total Pages | : 322 |
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Author | : IEEE Electron Devices Society |
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Total Pages | : 322 |
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Author | : Reliability Physics |
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Author | : Electrochemical Society. Dielectric Science and Technology Division |
Publisher | : The Electrochemical Society |
Total Pages | : 346 |
Release | : 1992 |
Genre | : Technology & Engineering |
ISBN | : 9781566770033 |
Papers in this volume are from the 180th ECS Meeting, held in held in Phoenix, Arizona, Fall 1991. This symposium addresses all aspects of reliability of semiconductor devices, multilevel interconnection and dielectric breakdown in VLSI and ULSI technologies. The symposium establishes reliability from design through manufacturing. The second part of the symposium addresses laser ablation/etching, laser planarization laser/UV. CVD of metal end dielectric films, laser/UV enhanced etching and deposition processesing liquid phase, and photomodification of surfaces.
Author | : J. W. McPherson |
Publisher | : Springer |
Total Pages | : 463 |
Release | : 2018-12-20 |
Genre | : Technology & Engineering |
ISBN | : 3319936832 |
This third edition textbook provides the basics of reliability physics and engineering that are needed by electrical engineers, mechanical engineers, civil engineers, biomedical engineers, materials scientists, and applied physicists to help them to build better devices/products. The information contained within should help all fields of engineering to develop better methodologies for: more reliable product designs, more reliable materials selections, and more reliable manufacturing processes— all of which should help to improve product reliability. A mathematics level through differential equations is needed. Also, a familiarity with the use of excel spreadsheets is assumed. Any needed statistical training and tools are contained within the text. While device failure is a statistical process (thus making statistics important), the emphasis of this book is clearly on the physics of failure and developing the reliability engineering tools required for product improvements during device-design and device-fabrication phases.
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Release | : 1989 |
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Total Pages | : 309 |
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