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Transmission Electron Microscopy Characterization of Nanomaterials

Transmission Electron Microscopy Characterization of Nanomaterials
Author: Challa S.S.R. Kumar
Publisher: Springer Science & Business Media
Total Pages: 718
Release: 2013-12-09
Genre: Science
ISBN: 3642389341

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Third volume of a 40volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Transmission electron microscopy characterization of nanomaterials. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.


Transmission Electron Microscopy Characterization of Nanomaterials

Transmission Electron Microscopy Characterization of Nanomaterials
Author: Challa S.S.R. Kumar
Publisher: Springer
Total Pages: 0
Release: 2016-08-23
Genre: Science
ISBN: 9783662524626

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Third volume of a 40volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Transmission electron microscopy characterization of nanomaterials. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.


Nanocharacterization Techniques

Nanocharacterization Techniques
Author: Osvaldo de Oliveira Jr
Publisher: William Andrew
Total Pages: 224
Release: 2017-03-18
Genre: Technology & Engineering
ISBN: 0323497799

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Nanocharacterization Techniques covers the main characterization techniques used in nanomaterials and nanostructures. The chapters focus on the fundamental aspects of characterization techniques and their distinctive approaches. Significant advances that have taken place over recent years in refining techniques are covered, and the mathematical foundations needed to use the techniques are also explained in detail. This book is an important reference for materials scientists and engineers looking for a through analysis of nanocharacterization techniques in order to establish which is best for their needs. Includes a detailed analysis of different nanocharacterization techniques, allowing readers to explore which one is best for their particular needs Provides examples of how each characterization technique has been used, giving readers a greater understanding of how each technique can be profitably used Covers the mathematical background needed to utilize each of these techniques to their best effect, meaning that readers can gain a full understanding of the theoretical principles behind each technique covered Serves as an important, go-to reference for materials scientists and engineers


Scanning Microscopy for Nanotechnology

Scanning Microscopy for Nanotechnology
Author: Weilie Zhou
Publisher: Springer Science & Business Media
Total Pages: 533
Release: 2007-03-09
Genre: Technology & Engineering
ISBN: 0387396209

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This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.


Microscopy Methods in Nanomaterials Characterization

Microscopy Methods in Nanomaterials Characterization
Author: Sabu Thomas
Publisher: Elsevier
Total Pages: 434
Release: 2017-05-17
Genre: Technology & Engineering
ISBN: 0323461476

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Microscopy Methods in Nanomaterials Characterization fills an important gap in the literature with a detailed look at microscopic and X-ray based characterization of nanomaterials. These microscopic techniques are used for the determination of surface morphology and the dispersion characteristics of nanomaterials. This book deals with the detailed discussion of these aspects, and will provide the reader with a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc. In addition, it covers the latest developments and trends morphological characterization using a variety of microscopes. Materials scientists, materials engineers and scientists in related disciplines, including chemistry and physics, will find this to be a detailed, method-orientated guide to microscopy methods of nanocharacterization. Takes a method-orientated approach that includes case studies that illustrate how to carry out each characterization technique Discusses the advantages and disadvantages of each microscopy characterization technique, giving the reader greater understanding of conditions for different techniques Presents an in-depth discussion of each technique, allowing the reader to gain a detailed understanding of each


In Situ Transmission Electron Microscopy Characterization of Nanomaterials

In Situ Transmission Electron Microscopy Characterization of Nanomaterials
Author: Joon Hwan Lee
Publisher:
Total Pages: 226
Release: 2013
Genre:
ISBN:

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With the recent development of in situ transmission electron microscopy (TEM) characterization techniques, the real time study of property-structure correlations in nanomaterials becomes possible. This dissertation reports the direct observations of deformation behavior of Al2O3-ZrO2-MgAl2O4 (AZM) bulk ceramic nanocomposites, strengthening mechanism of twins in YBa2Cu3O7−x (YBCO) thin film, work hardening event in nanocrystalline nickel and deformation of 2wt% Al doped ZnO (AZO) thin film with nanorod structures using the in situ TEM nanoindentation tool. The combined in situ movies with quantitative loading-unloading curves reveal the deformation mechanism of the above nanomaterial systems. At room temperature, in situ dynamic deformation studies show that the AZM nanocomposites undergo the deformation mainly through the grain-boundary sliding and rotation of small grains, i.e., ZrO2 grains, and some of the large grains, i.e., MgAl2O4 grains. We observed both plastic and elastic deformations in different sample regions in these multi-phase ceramic nanocomposites at room temperature. Both ex situ (conventional) and in situ nanoindentation were conducted to reveal the deformation of YBCO films from the directions perpendicular and parallel to the twin interfaces. Hardness measured perpendicular to twin interfaces is ~50% and 40% higher than that measured parallel to twin interfaces, by ex situ and in situ, respectively. By using an in situ nanoindentation tool inside TEM, dynamic work hardening event in nanocrystalline nickel was directly observed. During stain hardening stage, abundant Lomer-Cottrell (L-C) locks formed both within nanograins and against twin boundaries. Two major mechanisms were identified during interactions between L-C locks and twin boundaries. Quantitative nanoindentation experiments recorded during in situ experiments show an increase of yield strength from 1.64 to 2.29 GPa during multiple loading-unloading cycles. In situ TEM nanoindentation has been conducted to explore the size dependent deformation behavior of two different types (type I: ~ 0.51 of width/length ratio and type II: ~ 088 ratio) of AZO nanorods. During the indentation on type I nanord structure, annihilation of defects has been observed which is caused by limitation of the defect activities by relatively small size of the width. On the other hand, type II nanorod shows dislocation activities which enhanced the grain rotation under the external force applied on more isotropic direction through type II nanorod. The electronic version of this dissertation is accessible from http://hdl.handle.net/1969.1/148150


Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis

Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis
Author: Nobuo Tanaka
Publisher: World Scientific
Total Pages: 616
Release: 2014-08-21
Genre: Science
ISBN: 1783264713

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The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.


Advanced Transmission Electron Microscopy

Advanced Transmission Electron Microscopy
Author: Francis Leonard Deepak
Publisher: Springer
Total Pages: 281
Release: 2015-06-05
Genre: Technology & Engineering
ISBN: 3319151770

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This book highlights the current understanding of materials in the context of new and continuously emerging techniques in the field of electron microscopy. The authors present applications of electron microscopic techniques in characterizing various well-known & new nanomaterials. The applications described include both inorganic nanomaterials as well as organic nanomaterials.


The Transmission Electron Microscope

The Transmission Electron Microscope
Author: Khan Maaz
Publisher: BoD – Books on Demand
Total Pages: 362
Release: 2015-09-02
Genre: Science
ISBN: 9535121502

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This book The Transmission Electron Microscope abundantly illustrates necessary insight and guidance of this powerful and versatile material characterization technique with complete figures and thorough explanations. The second edition of the book presents deep understanding of new techniques from introduction to advance levels, covering in-situ transmission electron microscopy, electron and focused ion beam microscopy, and biological diagnostic through TEM. The chapters cover all major aspects of transmission electron microscopy and their uses in material characterization with special emphasis on both the theoretical and experimental aspects of modern electron microscopy techniques. It is believed that this book will provide a solid foundation of electron microscopy to the students, scientists, and engineers working in the field of material science and condensed matter physics.