Test Generation Of Crosstalk Delay Faults In Vlsi Circuits PDF Download
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Author | : S. Jayanthy |
Publisher | : Springer |
Total Pages | : 156 |
Release | : 2018-09-20 |
Genre | : Technology & Engineering |
ISBN | : 981132493X |
Download Test Generation of Crosstalk Delay Faults in VLSI Circuits Book in PDF, ePub and Kindle
This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.
Author | : Mohammad Tehranipoor |
Publisher | : Springer Science & Business Media |
Total Pages | : 228 |
Release | : 2011-09-08 |
Genre | : Technology & Engineering |
ISBN | : 1441982973 |
Download Test and Diagnosis for Small-Delay Defects Book in PDF, ePub and Kindle
This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise.
Author | : M.C. Bhuvaneswari |
Publisher | : Springer |
Total Pages | : 181 |
Release | : 2014-08-20 |
Genre | : Technology & Engineering |
ISBN | : 8132219589 |
Download Application of Evolutionary Algorithms for Multi-objective Optimization in VLSI and Embedded Systems Book in PDF, ePub and Kindle
This book describes how evolutionary algorithms (EA), including genetic algorithms (GA) and particle swarm optimization (PSO) can be utilized for solving multi-objective optimization problems in the area of embedded and VLSI system design. Many complex engineering optimization problems can be modelled as multi-objective formulations. This book provides an introduction to multi-objective optimization using meta-heuristic algorithms, GA and PSO and how they can be applied to problems like hardware/software partitioning in embedded systems, circuit partitioning in VLSI, design of operational amplifiers in analog VLSI, design space exploration in high-level synthesis, delay fault testing in VLSI testing and scheduling in heterogeneous distributed systems. It is shown how, in each case, the various aspects of the EA, namely its representation and operators like crossover, mutation, etc, can be separately formulated to solve these problems. This book is intended for design engineers and researchers in the field of VLSI and embedded system design. The book introduces the multi-objective GA and PSO in a simple and easily understandable way that will appeal to introductory readers.
Author | : Kyung Tek Lee |
Publisher | : |
Total Pages | : 214 |
Release | : 1999 |
Genre | : Integrated circuits |
ISBN | : |
Download Crosstalk fault test generation and hierarchical timing verification in VLSI digital circuits Book in PDF, ePub and Kindle
Author | : Marong Phadoongsidhi |
Publisher | : |
Total Pages | : 152 |
Release | : 2004 |
Genre | : |
ISBN | : |
Download High Level Test Methodology for Crosstalk Faults in Sequential Circuits Book in PDF, ePub and Kindle
Author | : |
Publisher | : |
Total Pages | : 250 |
Release | : 2009-07 |
Genre | : |
ISBN | : |
Download Computer Engineering & Apps Book in PDF, ePub and Kindle
Author | : Eugenio Villar Bonet |
Publisher | : Ed. Universidad de Cantabria |
Total Pages | : 180 |
Release | : 2001 |
Genre | : Computers |
ISBN | : 9788481022841 |
Download Design of Hardware/Software Embedded Systems Book in PDF, ePub and Kindle
Este libro presenta los desafíos planteados por las nuevas y sumamente poderosas tecnologías de integración de sistemas electrónicos, que están en la base de los cambios sociales hacia lo que llaman la Sociedad de la Información; en la que los dispositivos electrónicos se harán una parte incorporada de la vida diaria, encajados en casi cada producto. Es necesario un conocimiento cuidadoso de los desafíos para aprovechar la amplia gama de ocasiones ofrecidas por tales capacidades de integración y las correspondientes posibilidades de diseño de sistemas electrónicos.
Author | : Nisar Ahmed |
Publisher | : Springer Science & Business Media |
Total Pages | : 288 |
Release | : 2010-02-26 |
Genre | : Technology & Engineering |
ISBN | : 0387757287 |
Download Nanometer Technology Designs Book in PDF, ePub and Kindle
Traditional at-speed test methods cannot guarantee high quality test results as they face many new challenges. Supply noise effects on chip performance, high test pattern volume, small delay defect test pattern generation, high cost of test implementation and application, and utilizing low-cost testers are among these challenges. This book discusses these challenges in detail and proposes new techniques and methodologies to improve the overall quality of the transition fault test.
Author | : Ang Yang |
Publisher | : Springer |
Total Pages | : 372 |
Release | : 2008-03-22 |
Genre | : Technology & Engineering |
ISBN | : 3540762868 |
Download Success in Evolutionary Computation Book in PDF, ePub and Kindle
Evolutionary Computation (EC) includes a number of techniques such as Genetic Algorithms which have been used in a diverse range of highly successful applications. This book brings together some of these EC applications in fields including electronics, telecommunications, health, bioinformatics, supply chain and other engineering domains, to give the audience, including both EC researchers and practitioners, a glimpse of this exciting and rapidly-evolving field.
Author | : Sebastian Huhn |
Publisher | : Springer Nature |
Total Pages | : 164 |
Release | : 2021-04-19 |
Genre | : Technology & Engineering |
ISBN | : 3030692094 |
Download Design for Testability, Debug and Reliability Book in PDF, ePub and Kindle
This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testability, debug, and reliability, as strictly required for state-of-the-art circuit designs. In particular, this book combines formal techniques, such as the Satisfiability (SAT) problem and the Bounded Model Checking (BMC), to address the arising challenges concerning the increase in test data volume, as well as test application time and the required reliability. All methods are discussed in detail and evaluated extensively, while considering industry-relevant benchmark candidates. All measures have been integrated into a common framework, which implements standardized software/hardware interfaces.