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| Author | : Andrew Carl Miner |
| Publisher | : |
| Total Pages | : 284 |
| Release | : 2002 |
| Genre | : |
| ISBN | : |
| Author | : Sergei V. Kalinin |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 1002 |
| Release | : 2007-04-03 |
| Genre | : Technology & Engineering |
| ISBN | : 0387286683 |
This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical introduction into the field. This volume will also address the fundamental physical phenomena underpinning the imaging mechanism of SPMs.
| Author | : Dror Sarid |
| Publisher | : John Wiley & Sons |
| Total Pages | : 310 |
| Release | : 2007-02-27 |
| Genre | : Science |
| ISBN | : 3527609873 |
This new and completely updated edition features not only an accompanying CD-ROM, but also a new applications section, reflecting the many breakthroughs in the field over the last few years. It provides a complete set of computational models that describe the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies. The result is both a solid professional reference and an advanced-level text, beginning with the basics and moving on to the latest techniques, experiments, and theory. In the section devoted to atomic force microscopy, the author describes the mechanical properties of cantilevers, atomic force microscope tip-sample interactions, and cantilever vibration characteristics. This is followed by an in-depth treatment of theoretical and practical aspects of tunneling phenomena, including metal-insulator-metal tunneling and Fowler-Nordheim field emission. The final section features applications, dealing with, among others, Kelvin and Raman probe microscopy. The self-contained presentation spares researchers valuable time spent hunting through the technical literature for the theoretical results required to understand the models presented. The Mathematica code for all the examples is included in the CD-ROM, affording the freedom to change the values and parameters of specific problems as desired, or even modify the programs themselves to suit various modeling needs.
| Author | : Vladimir V. Tsukruk |
| Publisher | : John Wiley & Sons |
| Total Pages | : 663 |
| Release | : 2012-01-09 |
| Genre | : Technology & Engineering |
| ISBN | : 3527639969 |
Well-structured and adopting a pedagogical approach, this self-contained monograph covers the fundamentals of scanning probe microscopy, showing how to use the techniques for investigating physical and chemical properties on the nanoscale and how they can be used for a wide range of soft materials. It concludes with a section on the latest techniques in nanomanipulation and patterning. This first book to focus on the applications is a must-have for both newcomers and established researchers using scanning probe microscopy in soft matter research. From the contents: * Atomic Force Microscopy and Other Advanced Imaging Modes * Probing of Mechanical, Thermal Chemical and Electrical Properties * Amorphous, Poorly Ordered and Organized Polymeric Materials * Langmuir-Blodgett and Layer-by-Layer Structures * Multi-Component Polymer Systems and Fibers * Colloids and Microcapsules * Biomaterials and Biological Structures * Nanolithography with Intrusive AFM Tipand Dip-Pen Nanolithography * Microcantilever-Based Sensors
| Author | : Meier, Tobias |
| Publisher | : KIT Scientific Publishing |
| Total Pages | : 192 |
| Release | : 2014-10-02 |
| Genre | : Technology & Engineering |
| ISBN | : 3731502534 |
This work presents approaches to extend limits of scanning probe microscopy techniques towards more versatile instruments using integrated sensor concepts. For structural surface analysis, magnetoresistive sensing is introduced and thermoresistive sensing is applied to study nanoscale phonon transport in chain-like molecules. Investigating with these techniques the properties of shape memory polymers, a fabrication method to design application-inspired micro- and nanostructures is introduced.
| Author | : Bharat Bhushan |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 823 |
| Release | : 2010-12-17 |
| Genre | : Technology & Engineering |
| ISBN | : 3642104975 |
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
| Author | : Dawn A. Bonnell |
| Publisher | : World Scientific |
| Total Pages | : 640 |
| Release | : 2013 |
| Genre | : Technology & Engineering |
| ISBN | : 981443471X |
Efficiency and life time of solar cells, energy and power density of the batteries, and costs of the fuel cells alike cannot be improved unless the complex electronic, optoelectronic, and ionic mechanisms underpinning operation of these materials and devices are understood on the nanometer level of individual defects. Only by probing these phenomena locally can we hope to link materials structure and functionality, thus opening pathway for predictive modeling and synthesis. While structures of these materials are now accessible on length scales from macroscopic to atomic, their functionality has remained Terra Incognitae. In this volume, we provide a summary of recent advances in scanning probe microscopy studies of local functionality of energy materials and devices ranging from photovoltaics to batteries, fuel cells, and energy harvesting systems. Recently emergent SPM modes and combined SPM-electron microscopy approaches are also discussed. Contributions by internationally renowned leaders in the field describe the frontiers in this important field.
| Author | : Laurene Tetard |
| Publisher | : American Chemical Society |
| Total Pages | : 203 |
| Release | : 2023-05-22 |
| Genre | : Science |
| ISBN | : 0841299579 |
Techniques of nanoscale functional imaging and spectroscopy have blossomed since the invention of scanning probe microscopy (SPM) tools, starting with scanning tunneling microscopy in the early 1980s. The ability to resolve topographical features with nanoscale—sometimes atomic—precision has revolutionized our understanding of molecules, matter, and living systems. These observations have led scientists to pose increasingly more complex questions about properties beyond morphology and their evolution upon external stimuli. Overall, SPM-based schemes provide versatile ways to probe structural, electrical, mechanical, and chemical properties of materials at the nanoscale. Getting started with SPM can be intimidating. This digital primer aims to provide undergraduate and graduate students majoring in various fields of science and engineering with a practical guide to grasp essential concepts and principles related to SPM image and spectra formation and their interpretation. This guide may also be helpful to researchers who are considering new ways of evaluating nanoscale properties of materials, devices, or living systems as applicable to their respective fields. Because of the extensive literature on the developments and applications of SPM, it was impossible to comprehensively cover all aspects of the field. Hence, deliberate choices were made to emphasize some techniques that have not been discussed as extensively in the literature but hold great promise to understand complex systems at the nanoscale.
| Author | : Vijay Nalladega |
| Publisher | : BoD – Books on Demand |
| Total Pages | : 258 |
| Release | : 2012-04-27 |
| Genre | : Science |
| ISBN | : 9535105760 |
Scanning probe microscopy (SPM) is one of the key enabling tools for the advancement for nanotechnology with applications in many interdisciplinary research areas. This book presents selected original research works on the application of scanning probe microscopy techniques for the characterization of physical properties of different materials at the nanoscale. The topics in the book range from surface morphology analysis of thin film structures, oxide thin layers and superconducting structures, novel scanning probe microscopy techniques for characterization of mechanical and electrical properties, evaluation of mechanical and tribological properties of hybrid coatings and thin films. The variety of topics chosen for the book underlines the strong interdisciplinary nature of the research work in the field of scanning probe microscopy.
| Author | : Jaime Andres Perez Taborda |
| Publisher | : BoD – Books on Demand |
| Total Pages | : 288 |
| Release | : 2019-01-03 |
| Genre | : Technology & Engineering |
| ISBN | : 1789848709 |
The field of coatings and thin-film technologies is rapidly advancing to keep up with new uses for semiconductor, optical, tribological, thermoelectric, solar, security, and smart sensing applications, among others. In this sense, thin-film coatings and structures are increasingly sophisticated with more specific properties, new geometries, large areas, the use of heterogeneous materials and flexible and rigid coating substrates to produce thin-film structures with improved performance and properties in response to new challenges that the industry presents. This book aims to provide the reader with a complete overview of the current state of applications and developments in thin-film technology, discussing applications, health and safety in thin films, and presenting reviews and experimental results of recognized experts in the area of coatings and thin-film technologies.
