Radiation Effects In Semiconductors And Semiconductor Devices PDF Download
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Author | : Krzysztof Iniewski |
Publisher | : CRC Press |
Total Pages | : 432 |
Release | : 2018-09-03 |
Genre | : Technology & Engineering |
ISBN | : 1439826951 |
Download Radiation Effects in Semiconductors Book in PDF, ePub and Kindle
Space applications, nuclear physics, military operations, medical imaging, and especially electronics (modern silicon processing) are obvious fields in which radiation damage can have serious consequences, i.e., degradation of MOS devices and circuits. Zeroing in on vital aspects of this broad and complex topic, Radiation Effects in Semiconductors addresses the ever-growing need for a clear understanding of radiation effects on semiconductor devices and circuits to combat potential damage it can cause. Features a chapter authored by renowned radiation authority Lawrence T. Clark on Radiation Hardened by Design SRAM Strategies for TID and SEE Mitigation This book analyzes the radiation problem, focusing on the most important aspects required for comprehending the degrading effects observed in semiconductor devices, circuits, and systems when they are irradiated. It explores how radiation interacts with solid materials, providing a detailed analysis of three ways this occurs: Photoelectric effect, Compton effect, and creation of electron-positron pairs. The author explains that the probability of these three effects occurring depends on the energy of the incident photon and the atomic number of the target. The book also discusses the effects that photons can have on matter—in terms of ionization effects and nuclear displacement Written for post-graduate researchers, semiconductor engineers, and nuclear and space engineers with some electronics background, this carefully constructed reference explains how ionizing radiation is creating damage in semiconducting devices and circuits and systems—and how that damage can be avoided in areas such as military/space missions, nuclear applications, plasma damage, and X-ray-based techniques. It features top-notch international experts in industry and academia who address emerging detector technologies, circuit design techniques, new materials, and innovative system approaches.
Author | : V. S. Vavilov |
Publisher | : Springer Science & Business Media |
Total Pages | : 280 |
Release | : 2012-12-06 |
Genre | : Science |
ISBN | : 1468490699 |
Download Radiation Effects in Semiconductors and Semiconductor Devices Book in PDF, ePub and Kindle
Author | : C. Claeys |
Publisher | : Springer Science & Business Media |
Total Pages | : 424 |
Release | : 2013-11-11 |
Genre | : Science |
ISBN | : 3662049740 |
Download Radiation Effects in Advanced Semiconductor Materials and Devices Book in PDF, ePub and Kindle
This wide-ranging book summarizes the current knowledge of radiation defects in semiconductors, outlining the shortcomings of present experimental and modelling techniques and giving an outlook on future developments. It also provides information on the application of sensors in nuclear power plants.
Author | : V. S Vavilov |
Publisher | : |
Total Pages | : 284 |
Release | : 1995-12-31 |
Genre | : |
ISBN | : 9781468490701 |
Download Radiation Effects in Semiconductors and Semiconducting Devices Book in PDF, ePub and Kindle
Author | : V. S. Vavilov |
Publisher | : |
Total Pages | : 0 |
Release | : 1973 |
Genre | : |
ISBN | : |
Download Radiation effects in semiconductors and semiconductor devices Book in PDF, ePub and Kindle
Author | : Allan H Johnston |
Publisher | : World Scientific |
Total Pages | : 376 |
Release | : 2010-04-27 |
Genre | : Technology & Engineering |
ISBN | : 9814467650 |
Download Reliability And Radiation Effects In Compound Semiconductors Book in PDF, ePub and Kindle
This book focuses on reliability and radiation effects in compound semiconductors, which have evolved rapidly during the last 15 years. It starts with first principles, and shows how advances in device design and manufacturing have suppressed many of the older reliability mechanisms.It is the first book that comprehensively covers reliability and radiation effects in optoelectronic as well as microelectronic devices. It contrasts reliability mechanisms of compound semiconductors with those of silicon-based devices, and shows that the reliability of many compound semiconductors has improved to the level where they can be used for ten years or more with low failure rates.
Author | : Frank Larin |
Publisher | : |
Total Pages | : 312 |
Release | : 1968 |
Genre | : Semiconductors |
ISBN | : |
Download Radiation Effects in Semiconductor Devices Book in PDF, ePub and Kindle
Author | : Ronald D Schrimpf |
Publisher | : World Scientific |
Total Pages | : 349 |
Release | : 2004-07-29 |
Genre | : Technology & Engineering |
ISBN | : 9814482153 |
Download Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices Book in PDF, ePub and Kindle
This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.
Author | : Los Alamos Scientific Laboratory |
Publisher | : |
Total Pages | : 80 |
Release | : 1961 |
Genre | : Radiation |
ISBN | : |
Download Radiation Effects on Semiconductor Devices Book in PDF, ePub and Kindle
Author | : Allan H. Johnston |
Publisher | : World Scientific |
Total Pages | : 376 |
Release | : 2010 |
Genre | : Technology & Engineering |
ISBN | : 9814277118 |
Download Reliability and Radiation Effects in Compound Semiconductors Book in PDF, ePub and Kindle
This book focuses on reliability and radiation effects in compound semiconductors, which have evolved rapidly during the last 15 years. It starts with first principles, and shows how advances in device design and manufacturing have suppressed many of the older reliability mechanisms. It is the first book that comprehensively covers reliability and radiation effects in optoelectronic as well as microelectronic devices. It contrasts reliability mechanisms of compound semiconductors with those of silicon-based devices, and shows that the reliability of many compound semiconductors has improved to the level where they can be used for ten years or more with low failure rates.