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Progress in Transmission Electron Microscopy 1

Progress in Transmission Electron Microscopy 1
Author: Xiao-Feng Zhang
Publisher: Springer Science & Business Media
Total Pages: 400
Release: 2001-10-18
Genre: Medical
ISBN: 9783540676805

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Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume I concentrates on the newly developed concepts and methods which are making TEM a powerful and indispensible tool in materials science.


Progress in Transmission Electron Microscopy 2

Progress in Transmission Electron Microscopy 2
Author: Xiao-Feng Zhang
Publisher: Springer Science & Business Media
Total Pages: 342
Release: 2001-10-18
Genre: Medical
ISBN: 9783540676812

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Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume 2 illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.


Progress in Transmission Electron Microscopy 1

Progress in Transmission Electron Microscopy 1
Author: Xiao-Feng Zhang
Publisher: Springer
Total Pages: 0
Release: 2001
Genre: Technology & Engineering
ISBN: 9783662095188

Download Progress in Transmission Electron Microscopy 1 Book in PDF, ePub and Kindle

Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications.


Progress in Transmission Electron Microscopy 2

Progress in Transmission Electron Microscopy 2
Author: Xiao-Feng Zhang
Publisher: Springer
Total Pages: 0
Release: 2010-10-19
Genre: Technology & Engineering
ISBN: 9783642087189

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Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume II illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.


Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics
Author:
Publisher: Academic Press
Total Pages: 439
Release: 2009-11-05
Genre: Technology & Engineering
ISBN: 0080961584

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Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This particular volume presents several timely articles on the scanning transmission electron microscope. Updated with contributions from leading international scholars and industry experts Discusses hot topic areas and presents current and future research trends Provides an invaluable reference and guide for physicists, engineers and mathematicians


Transmission Electron Microscopy

Transmission Electron Microscopy
Author: Ludwig Reimer
Publisher: Springer
Total Pages: 595
Release: 2013-11-11
Genre: Technology & Engineering
ISBN: 3662148242

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Transmission Electron Microscopy presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematic and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray micronanalysis and electron energy-loss spectroscopy are treated as analytical methods. This fourth edition includes discussions of recent progress, especially in the area of Schottky emission guns, convergent-beam electron diffraction, electron tomography, holography and the high resolution of crystal lattices.


Progress in Nanoscale Characterization and Manipulation

Progress in Nanoscale Characterization and Manipulation
Author: Rongming Wang
Publisher: Springer
Total Pages: 511
Release: 2018-08-30
Genre: Science
ISBN: 9811304548

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This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research. The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.