Proceedings Of The 2013 Ieee International Symposium On Defect And Fault Tolerance In Vlsi And Nanotechnology Systems Dfts PDF Download

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Proceedings of the International Conference on Computing and Communication Systems

Proceedings of the International Conference on Computing and Communication Systems
Author: Arnab Kumar Maji
Publisher: Springer Nature
Total Pages: 731
Release: 2021-04-11
Genre: Technology & Engineering
ISBN: 9813340843

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This book contains the latest research work presented at the International Conference on Computing and Communication Systems (I3CS 2020) held at North-Eastern Hill University (NEHU), Shillong, India. The book presents original research results, new ideas and practical development experiences which concentrate on both theory and practices. It includes papers from all areas of information technology, computer science, electronics and communication engineering written by researchers, scientists, engineers and scholar students and experts from India and abroad.


Proceedings of Seventh International Congress on Information and Communication Technology

Proceedings of Seventh International Congress on Information and Communication Technology
Author: Xin-She Yang
Publisher: Springer Nature
Total Pages: 910
Release: 2022-08-02
Genre: Technology & Engineering
ISBN: 9811916071

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This book gathers selected high-quality research papers presented at the Seventh International Congress on Information and Communication Technology, held at Brunel University, London, on February 21–24, 2022. It discusses emerging topics pertaining to information and communication technology (ICT) for managerial applications, e-governance, e-agriculture, e-education and computing technologies, the Internet of Things (IoT) and e-mining. Written by respected experts and researchers working on ICT, the book offers a valuable asset for young researchers involved in advanced studies. The work is presented in four volumes.


Proceedings of International Conference on Communication, Circuits, and Systems

Proceedings of International Conference on Communication, Circuits, and Systems
Author: Sukanta Kumar Sabut
Publisher: Springer Nature
Total Pages: 575
Release: 2021-04-02
Genre: Computers
ISBN: 9813348666

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The book proposes new technologies and discusses innovative solutions to various problems in the field of communication, circuits, and systems, as reflected in high-quality papers presented at International Conference on Communication, Circuits, and Systems (IC3S 2020) held at KIIT, Bhubaneswar, India from 16 – 18 October 2020. It brings together new works from academicians, scientists, industry professionals, scholars, and students together to exchange research outcomes and open up new horizons in the areas of signal processing, communications, and devices.


ISTFA 2018: Proceedings from the 44th International Symposium for Testing and Failure Analysis

ISTFA 2018: Proceedings from the 44th International Symposium for Testing and Failure Analysis
Author:
Publisher: ASM International
Total Pages:
Release: 2018-12-01
Genre:
ISBN: 1627080996

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The International Symposium for Testing and Failure Analysis (ISTFA) 2018 is co-located with the International Test Conference (ITC) 2018, October 28 to November 1, in Phoenix, Arizona, USA at the Phoenix Convention Center. The theme for the November 2018 conference is "Failures Worth Analyzing." While technology advances fast and the market demands the latest and the greatest, successful companies strive to stay competitive and remain profitable.


2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
Author: IEEE Staff
Publisher:
Total Pages:
Release: 2016-09-19
Genre:
ISBN: 9781509036240

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DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI systems inclusive of emerging technologies One of the unique features of this symposium is to combine new academic research with state of the art industrial data, necessary ingredients for significant advances in this field All aspects of design, manufacturing, test, reliability, and availability that are affected by defects during manufacturing and by faults during system operation are of interest


Nanoelectronics

Nanoelectronics
Author: Robert Puers
Publisher: John Wiley & Sons
Total Pages: 692
Release: 2017-04-11
Genre: Technology & Engineering
ISBN: 3527800719

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Offering first-hand insights by top scientists and industry experts at the forefront of R&D into nanoelectronics, this book neatly links the underlying technological principles with present and future applications. A brief introduction is followed by an overview of present and emerging logic devices, memories and power technologies. Specific chapters are dedicated to the enabling factors, such as new materials, characterization techniques, smart manufacturing and advanced circuit design. The second part of the book provides detailed coverage of the current state and showcases real future applications in a wide range of fields: safety, transport, medicine, environment, manufacturing, and social life, including an analysis of emerging trends in the internet of things and cyber-physical systems. A survey of main economic factors and trends concludes the book. Highlighting the importance of nanoelectronics in the core fields of communication and information technology, this is essential reading for materials scientists, electronics and electrical engineers, as well as those working in the semiconductor and sensor industries.