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Nonlinear X-Ray Spectroscopy for Materials Science

Nonlinear X-Ray Spectroscopy for Materials Science
Author: Iwao Matsuda
Publisher: Springer Nature
Total Pages: 170
Release: 2023-11-15
Genre: Science
ISBN: 9819967147

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X-ray experiments have been used widely in materials science, and conventional spectroscopy has been based on linear responses in light–matter interactions. Recent development of ultrafast light sources of tabletop lasers and X-ray free electron lasers reveals nonlinear optical phenomena in the X-ray region, and the measurement signals have been found to carry a further wealth of information on materials. This book overviews such nonlinear X-ray spectroscopy and its related issues for materials science. Each chapter is written by pioneers in the field and skillfully reviews the topics of nonlinear spectroscopy including X-ray multi-photon absorption and X-ray second harmonic generation. The chapters are divided depending on photon wavelength, ranging from extreme ultraviolet to (soft) X-ray. To facilitate readers’ comprehensive understanding, some of the chapters cover the conventional linear X-ray spectroscopy and basic principles of the non-linear responses. The book is mainly accessible as a primer for junior/senior- or graduate-level readers, and it also serves as a useful reference or guide even for established researchers in optical spectroscopy. The book offers readers opportunities to benefit from cutting-edge research in this new area of nonlinear X-ray spectroscopy.


Auger- and X-Ray Photoelectron Spectroscopy in Materials Science

Auger- and X-Ray Photoelectron Spectroscopy in Materials Science
Author: Siegfried Hofmann
Publisher: Springer Science & Business Media
Total Pages: 544
Release: 2012-10-25
Genre: Science
ISBN: 3642273807

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To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.


X-ray Absorption Spectroscopy for the Chemical and Materials Sciences

X-ray Absorption Spectroscopy for the Chemical and Materials Sciences
Author: John Evans
Publisher: Wiley
Total Pages: 224
Release: 2018-01-02
Genre: Technology & Engineering
ISBN: 9781118676196

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A clear-cut introduction to the technique and applications of x-ray absorption spectroscopy X-ray Absorption Spectroscopy is being applied to a widening set of disciplines. Applications started with solid state physics and grew to materials science, chemistry, biochemistry and geology. Now, they cut across engineering materials, environmental science and national heritage - providing very detailed and useful information facilitating understanding and development of materials. This practical guide helps investigators choose the right experiment, carry it out properly and analyze the data to give the best reliable result. It gives readers insights to extract what they need from the world of large-scale experimental facilities like synchrotrons, which seem distant to many laboratory scientists. X-ray Absorption Spectroscopy for the Chemical and Materials Sciences seeks to educate readers about the strengths and limitations of the techniques, including their accessibility. Presented in six sections, it offers chapters that cover: an introduction to X-ray absorption fine structure XAFS; the basis of XAFS; X-ray sources; experimental methods; data analysis and simulation methods; and case studies.-A no-nonsense introduction to the technique and applications of x-ray absorption spectroscopy -Features Questions to support learning through the book -Relevant to all working on synchrotron sources and applications in physics, materials, environment/geology and biomedical materials -Four-color representation allows easy interpretation of images and data for the reader X-ray Absorption Spectroscopy for the Chemical and Materials Sciences is aimed at Masters-level and PhD students embarking on X-ray spectroscopy projects as well as scientists in areas of materials characterization.


Handbook of Practical X-Ray Fluorescence Analysis

Handbook of Practical X-Ray Fluorescence Analysis
Author: Burkhard Beckhoff
Publisher: Springer Science & Business Media
Total Pages: 897
Release: 2007-05-18
Genre: Science
ISBN: 3540367225

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X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students.


X-Ray Spectroscopy

X-Ray Spectroscopy
Author: Shatendra K Sharma
Publisher: BoD – Books on Demand
Total Pages: 294
Release: 2012-02-01
Genre: Technology & Engineering
ISBN: 9533079673

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The x-ray is the only invention that became a regular diagnostic tool in hospitals within a week of its first observation by Roentgen in 1895. Even today, x-rays are a great characterization tool at the hands of scientists working in almost every field, such as medicine, physics, material science, space science, chemistry, archeology, and metallurgy. With vast existing applications of x-rays, it is even more surprising that every day people are finding new applications of x-rays or refining the existing techniques. This book consists of selected chapters on the recent applications of x-ray spectroscopy that are of great interest to the scientists and engineers working in the fields of material science, physics, chemistry, astrophysics, astrochemistry, instrumentation, and techniques of x-ray based characterization. The chapters have been grouped into two major sections based upon the techniques and applications. The book covers some basic principles of satellite x-rays as characterization tools for chemical properties and the physics of detectors and x-ray spectrometer. The techniques like EDXRF, WDXRF, EPMA, satellites, micro-beam analysis, particle induced XRF, and matrix effects are discussed. The characterization of thin films and ceramic materials using x-rays is also covered.


X-ray Characterization of Materials

X-ray Characterization of Materials
Author: Eric Lifshin
Publisher: John Wiley & Sons
Total Pages: 277
Release: 2008-07-11
Genre: Technology & Engineering
ISBN: 3527613757

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Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental composition and crystal and grain structures of all types of materials. The challenge to the materials characterization expert is to understand how specific instruments and analytical techniques can provide detailed information about what makes each material unique. The challenge to the materials scientist, chemist, or engineer is to know what information is needed to fully characterize each material and how to use this information to explain its behavior, develop new and improved properties, reduce costs, or ensure compliance with regulatory requirements. This comprehensive handbook presents all the necessary background to understand the applications of X-ray analysis to materials characterization with particular attention to the modern approach to these methods.


Nonlinear Optics, Quantum Optics, and Ultrafast Phenomena with X-Rays

Nonlinear Optics, Quantum Optics, and Ultrafast Phenomena with X-Rays
Author: Bernhard Adams
Publisher: Springer Science & Business Media
Total Pages: 364
Release: 2003-08-31
Genre: Science
ISBN: 9781402074752

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Nonlinear Optics, Quantum Optics, and Ultrafast Phenomena with X-Rays is an introduction to cutting-edge science that is beginning to emerge on state-of-the-art synchrotron radiation facilities and will come to flourish with the x-ray free-electron lasers currently being planned. It is intended for the use by scientists at synchrotron radiation facilities working with the combination of x-rays and lasers and those preparing for the science at x-ray free-electron lasers. In the past decade synchrotron radiation sources have experienced a tremendous increase in their brilliance and other figures of merit. This progress, driven strongly by the scientific applications, is still going on and may actually be accelerating with the advent of x-ray free-electron lasers. As a result, a confluence of x-ray and laser physics is taking place, due to the increasing importance of laser concepts, such as coherence and nonlinear optics to the x-ray community and the importance of x-ray optics to the laser-generation of ultrashort pulses of x-rays.


Quantitative X-Ray Spectrometry, Second Edition,

Quantitative X-Ray Spectrometry, Second Edition,
Author: Ron Jenkins
Publisher: CRC Press
Total Pages: 512
Release: 1995-04-26
Genre: Science
ISBN: 9780824795542

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This work covers important aspects of X-ray spectrometry, from basic principles to the selection of instrument parameters and sample preparation. This edition explicates the use of combined X-ray fluorescence and X-ray diffraction data, and features new applications in environmental studies, forensic science, archeometry and the analysis of metals and alloys, minerals and ore, ceramic materials, catalysts and trace metals.;This work is intended for spectroscopists, analytical chemists, materials scientists, experimental physicists, mineralogists, biologists, geologists and graduate-level students in these disciplines.


Laboratory Micro-X-Ray Fluorescence Spectroscopy

Laboratory Micro-X-Ray Fluorescence Spectroscopy
Author: Michael Haschke
Publisher: Springer Science & Business Media
Total Pages: 367
Release: 2014-05-08
Genre: Science
ISBN: 3319048643

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Micro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems. This analytical technique has shown a dynamic development in the last 15 years and is used for the analysis of small particles, inclusions, of elemental distributions for a wide range of different applications both in research and quality control. The first experiments were performed on synchrotrons but there is a requirement for laboratory instruments which offers a fast and immediate access for analytical results. The book discuss the main components of a μ-XRF instrument and the different measurement modes, it gives an overview about the various instruments types, considers the special requirements for quantification of non-homogeneous materials and presents a wide range of application for single point and multi-point analysis as well as for distribution analysis in one, two and three dimensions.


X-Ray Absorption and X-Ray Emission Spectroscopy

X-Ray Absorption and X-Ray Emission Spectroscopy
Author: Jeroen A. van Bokhoven
Publisher: John Wiley & Sons
Total Pages: 896
Release: 2016-01-08
Genre: Science
ISBN: 1118844262

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During the last two decades, remarkable and often spectacular progress has been made in the methodological and instrumental aspects of x–ray absorption and emission spectroscopy. This progress includes considerable technological improvements in the design and production of detectors especially with the development and expansion of large-scale synchrotron reactors All this has resulted in improved analytical performance and new applications, as well as in the perspective of a dramatic enhancement in the potential of x–ray based analysis techniques for the near future. This comprehensive two-volume treatise features articles that explain the phenomena and describe examples of X–ray absorption and emission applications in several fields, including chemistry, biochemistry, catalysis, amorphous and liquid systems, synchrotron radiation, and surface phenomena. Contributors explain the underlying theory, how to set up X–ray absorption experiments, and how to analyze the details of the resulting spectra. X-Ray Absorption and X-ray Emission Spectroscopy: Theory and Applications: Combines the theory, instrumentation and applications of x-ray absorption and emission spectroscopies which offer unique diagnostics to study almost any object in the Universe. Is the go-to reference book in the subject for all researchers across multi-disciplines since intense beams from modern sources have revolutionized x-ray science in recent years Is relevant to students, postdocurates and researchers working on x-rays and related synchrotron sources and applications in materials, physics, medicine, environment/geology, and biomedical materials