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Microscopy Methods in Nanomaterials Characterization

Microscopy Methods in Nanomaterials Characterization
Author: Sabu Thomas
Publisher: Elsevier
Total Pages: 432
Release: 2017-05-17
Genre: Technology & Engineering
ISBN: 0323461476

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Microscopy Methods in Nanomaterials Characterization fills an important gap in the literature with a detailed look at microscopic and X-ray based characterization of nanomaterials. These microscopic techniques are used for the determination of surface morphology and the dispersion characteristics of nanomaterials. This book deals with the detailed discussion of these aspects, and will provide the reader with a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc. In addition, it covers the latest developments and trends morphological characterization using a variety of microscopes. Materials scientists, materials engineers and scientists in related disciplines, including chemistry and physics, will find this to be a detailed, method-orientated guide to microscopy methods of nanocharacterization. Takes a method-orientated approach that includes case studies that illustrate how to carry out each characterization technique Discusses the advantages and disadvantages of each microscopy characterization technique, giving the reader greater understanding of conditions for different techniques Presents an in-depth discussion of each technique, allowing the reader to gain a detailed understanding of each


Nanocharacterization Techniques

Nanocharacterization Techniques
Author: Osvaldo de Oliveira, Jr
Publisher: William Andrew
Total Pages: 222
Release: 2017-03-18
Genre: Technology & Engineering
ISBN: 0323497799

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Nanocharacterization Techniques covers the main characterization techniques used in nanomaterials and nanostructures. The chapters focus on the fundamental aspects of characterization techniques and their distinctive approaches. Significant advances that have taken place over recent years in refining techniques are covered, and the mathematical foundations needed to use the techniques are also explained in detail. This book is an important reference for materials scientists and engineers looking for a through analysis of nanocharacterization techniques in order to establish which is best for their needs. Includes a detailed analysis of different nanocharacterization techniques, allowing readers to explore which one is best for their particular needs Provides examples of how each characterization technique has been used, giving readers a greater understanding of how each technique can be profitably used Covers the mathematical background needed to utilize each of these techniques to their best effect, meaning that readers can gain a full understanding of the theoretical principles behind each technique covered Serves as an important, go-to reference for materials scientists and engineers


Scanning Microscopy for Nanotechnology

Scanning Microscopy for Nanotechnology
Author: Weilie Zhou
Publisher: Springer Science & Business Media
Total Pages: 533
Release: 2007-03-09
Genre: Technology & Engineering
ISBN: 0387396209

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This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.


Transmission Electron Microscopy Characterization of Nanomaterials

Transmission Electron Microscopy Characterization of Nanomaterials
Author: Challa S.S.R. Kumar
Publisher: Springer Science & Business Media
Total Pages: 718
Release: 2013-12-09
Genre: Science
ISBN: 3642389341

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Third volume of a 40volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Transmission electron microscopy characterization of nanomaterials. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.


Spectroscopic Methods for Nanomaterials Characterization

Spectroscopic Methods for Nanomaterials Characterization
Author: Sabu Thomas
Publisher: Elsevier
Total Pages: 444
Release: 2017-05-19
Genre: Technology & Engineering
ISBN: 0323461468

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Nanomaterials Characterization Techniques, Volume Two, part of an ongoing series, offers a detailed analysis of the different types of spectroscopic methods currently being used in nanocharacterization. These include, for example, the Raman spectroscopic method for the characterization of carbon nanotubes (CNTs). This book outlines the different kinds of spectroscopic tools being used for the characterization of nanomaterials and discusses under what conditions each should be used. The book is intended to cover all the major spectroscopic techniques for nanocharacterization, making it an important resource for both the academic community at the research level and the industrial community involved in nanomanufacturing. Explores how spectroscopy and X-ray-based nanocharacterization techniques are applied in modern industry Analyzes all the major spectroscopy and X-ray-based nanocharacterization techniques, allowing the reader to choose the best for their situation Presents a method-orientated approach that explains how to successfully use each technique


In-situ Characterization Techniques for Nanomaterials

In-situ Characterization Techniques for Nanomaterials
Author: Challa S.S.R. Kumar
Publisher: Springer
Total Pages: 452
Release: 2018-04-17
Genre: Technology & Engineering
ISBN: 3662563223

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Seventh volume of a 40 volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about In-situ Characterization Techniques for Nanomaterials. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.


The Transmission Electron Microscope

The Transmission Electron Microscope
Author: Khan Maaz
Publisher: BoD – Books on Demand
Total Pages: 362
Release: 2015-09-02
Genre: Science
ISBN: 9535121502

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This book The Transmission Electron Microscope abundantly illustrates necessary insight and guidance of this powerful and versatile material characterization technique with complete figures and thorough explanations. The second edition of the book presents deep understanding of new techniques from introduction to advance levels, covering in-situ transmission electron microscopy, electron and focused ion beam microscopy, and biological diagnostic through TEM. The chapters cover all major aspects of transmission electron microscopy and their uses in material characterization with special emphasis on both the theoretical and experimental aspects of modern electron microscopy techniques. It is believed that this book will provide a solid foundation of electron microscopy to the students, scientists, and engineers working in the field of material science and condensed matter physics.


Magnetic Characterization Techniques for Nanomaterials

Magnetic Characterization Techniques for Nanomaterials
Author: Challa S.S.R. Kumar
Publisher: Springer
Total Pages: 0
Release: 2018-07-25
Genre: Technology & Engineering
ISBN: 9783662570821

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Sixth volume of a 40 volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Magnetic Characterization Techniques for Nanomaterials. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.


Materials Characterization

Materials Characterization
Author: Yang Leng
Publisher: John Wiley & Sons
Total Pages: 384
Release: 2009-03-04
Genre: Technology & Engineering
ISBN: 0470822996

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This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.


Characterization of Nanostructures

Characterization of Nanostructures
Author: Sverre Myhra
Publisher: CRC Press
Total Pages: 353
Release: 2012-06-12
Genre: Science
ISBN: 1439854157

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The techniques and methods that can be applied to materials characterization on the microscale are numerous and well-established. Divided into two parts, Characterization of Nanostructures provides thumbnail sketches of the most widely used techniques and methods that apply to nanostructures, and discusses typical applications to single nanoscale objects, as well as to ensembles of such objects. Section I: Techniques and Methods overviews the physical principles of the main techniques and describes those operational modes that are most relevant to nanoscale characterization. It provides sufficient technical detail so that readers and prospective users can gain an appreciation of the strengths and limitations of particular techniques. The section covers both mainstream and less commonly used techniques. Section II: Applications of Techniques to Structures of Different Dimensionalities and Functionalities deals with the methods for materials characterization of generic types of systems, using carefully chosen illustrations from the literature. Each chapter begins with a brief description of the materials and supplies a context for the methods for characterization. The volume concludes with a series of flow charts and brief descriptions of tactical issues. The authors focus on the needs of the research laboratory but also address those of quality control, industrial troubleshooting, and online analysis. Characterization of Nanostructures describes those techniques and their operational modes that are most relevant to nanoscale characterization. It is especially relevant to systems of different dimensionalities and functionalities. The book builds a bridge between generalists, who play vital roles in the post-disciplinary area of nanotechnology, and specialists, who view themselves as more in the context of the discipline.