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| Author | : Matthew R. Begley |
| Publisher | : Cambridge University Press |
| Total Pages | : 289 |
| Release | : 2017-03-24 |
| Genre | : Science |
| ISBN | : 1107131863 |
A comprehensive treatment of the mechanics of multilayers and its implications for reliability, with easy-to-use software to compute key results.
| Author | : J.W. Hutchinson |
| Publisher | : |
| Total Pages | : 45 |
| Release | : 1997 |
| Genre | : |
| ISBN | : |
| Author | : John W. Hutchinson |
| Publisher | : |
| Total Pages | : |
| Release | : 1996 |
| Genre | : |
| ISBN | : |
| Author | : Gero Decher |
| Publisher | : John Wiley & Sons |
| Total Pages | : 1157 |
| Release | : 2012-06-11 |
| Genre | : Technology & Engineering |
| ISBN | : 3527316485 |
This second, comprehensive edition of the pioneering book in this fi eld has been completely revised and extended, now stretching to two volumes. The result is a comprehensive summary of layer-by-layer assembled, truly hybrid nanomaterials and thin fi lms, covering organic, inorganic, colloidal, macromolecular, and biological components, as well as the assembly of nanoscale fi lms derived from them on surfaces. These two volumes are essential for anyone working in the field, as well as scientists and researchers active in materials development, who needs the key knowledge provided herein for linking the field of molecular self-assembly with the bio- and materials sciences.
| Author | : Ullrich Pietsch |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 432 |
| Release | : 2004-08-27 |
| Genre | : Technology & Engineering |
| ISBN | : 9780387400921 |
During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers.
| Author | : Maurice H. Francombe |
| Publisher | : Academic Press |
| Total Pages | : 415 |
| Release | : 2013-10-22 |
| Genre | : Science |
| ISBN | : 1483288927 |
Mechanic and Dielectric Properties deals with the mechanical and dielectric properties of thin films. Topics covered range from the deposition and mechanical properties of superlattice thin films to the preparation of hard coatings by sputtering and arc evaporation. The use of thin films in microwave acoustics is also discussed, along with ferroelectric films for integrated electronics and the physics, chemistry, and technology of electrochromic tungsten-oxide-based thin films. Comprised of five chapters, this volume begins with an analysis of the growth, characterization, and mechanical behavior of films comprising multilayers primarily of metal and refractory metallic compound components. The next chapter reviews the mechanical properties of hard coatings prepared by sputtering and arc evaporation, together with the influence of multilayer and gradient structures, and of film crystallinity, crystal orientation, and morphology, on properties such as hardness, coating smoothness, and friction behavior. Subsequent chapters focus on the unique role played by piezoelectric films in signal processing devices utilizing bulk or surface acoustic waves; the properties and applications of ferroelectric films in integrated electronics; and the underlying physics and chemistry of electrochromic tungsten-oxide-based thin films. This book should be of interest to physicists.
| Author | : Haibo Huang |
| Publisher | : |
| Total Pages | : 348 |
| Release | : 1998 |
| Genre | : Metallic films |
| ISBN | : |
| Author | : Alexander D. Pogrebnjak |
| Publisher | : Springer |
| Total Pages | : 380 |
| Release | : 2019-02-08 |
| Genre | : Technology & Engineering |
| ISBN | : 9811361339 |
This book highlights the latest advances in chemical and physical methods for thin-film deposition and surface engineering, including ion- and plasma-assisted processes, focusing on explaining the synthesis/processing–structure–properties relationship for a variety of thin-film systems. It covers topics such as advances in thin-film synthesis; new thin-film materials: diamond-like films, granular alloys, high-entropy alloys, oxynitrides, and intermetallic compounds; ultra-hard, wear- and oxidation-resistant and multifunctional coatings; superconducting, magnetic, semiconducting, and dielectric films; electrochemical and electroless depositions; thin-film characterization and instrumentation; and industrial applications.
| Author | : Olaf Stenzel |
| Publisher | : Springer Science & Business Media |
| Total Pages | : 285 |
| Release | : 2005-10-10 |
| Genre | : Science |
| ISBN | : 3540279059 |
The present monograph represents itself as a tutorial to the ?eld of optical properties of thin solid ?lms. It is neither a handbook for the thin ?lm prac- tioner,noranintroductiontointerferencecoatingsdesign,norareviewonthe latest developments in the ?eld. Instead, it is a textbook which shall bridge the gap between ground level knowledge on optics, electrodynamics, qu- tummechanics,andsolidstatephysicsononehand,andthemorespecialized level of knowledge presumed in typical thin ?lm optical research papers on the other hand. In writing this preface, I feel it makes sense to comment on three points, which all seem to me equally important. They arise from the following (- tually interconnected) three questions: 1. Who can bene?t from reading this book? 2. What is the origin of the particular material selection in this book? 3. Who encouraged and supported me in writing this book? Let me start with the ?rst question, the intended readership of this book. It should be of use for anybody, who is involved into the analysis of - tical spectra of a thin ?lm sample, no matter whether the sample has been prepared for optical or other applications. Thin ?lm spectroscopy may be r- evant in semiconductor physics, solar cell development, physical chemistry, optoelectronics, and optical coatings development, to give just a few ex- ples. The book supplies the reader with the necessary theoretical apparatus for understanding and modelling the features of the recorded transmission and re?ection spectra.
| Author | : Paolo Mele |
| Publisher | : Springer |
| Total Pages | : 320 |
| Release | : 2015-03-26 |
| Genre | : Technology & Engineering |
| ISBN | : 3319144782 |
This book provides a comprehensive overview of the science of nanostructured oxides. It details the fundamental techniques and methodologies involved in oxides thin film and bulk growth, characterization and device processing, as well as heterostructures. Both, experts in oxide nanostructures and experts in thin film heteroepitaxy, contribute the interactions described within this book.
