Electronic Reliability Design Handbook
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Total Pages | : 1098 |
Release | : 1988 |
Genre | : Electronic apparatus and appliances |
ISBN | : |
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Author | : |
Publisher | : |
Total Pages | : 1098 |
Release | : 1988 |
Genre | : Electronic apparatus and appliances |
ISBN | : |
Author | : Estats Units d'Amèrica. Department of Defense |
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Total Pages | : |
Release | : 1988 |
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Total Pages | : |
Release | : 1984 |
Genre | : Electronic apparatus and appliances |
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Author | : United States. Department of Defense |
Publisher | : |
Total Pages | : 906 |
Release | : 1988 |
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Author | : |
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Total Pages | : 480 |
Release | : 1984 |
Genre | : Electronic apparatus and appliances |
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Total Pages | : 1057 |
Release | : 1988 |
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This military Handbook is approved for use by all Departments and Agencies of the Department of Defense. This Electronic Reliability Design Handbook is an updating and extensive revision of the Reliability Design Handbook, published in 1976 by the Reliability Analysis Center under contract with RADC. The Handbook contains the most up-to-date, practical, pertinent guidelines for use by design engineers, reliability engineers, and managers to design, produce, and deploy reliable and maintainable military electronic equipment/systems at minimum life cycle cost. (rrh).
Author | : Norman. B. Fuqua |
Publisher | : CRC Press |
Total Pages | : 409 |
Release | : 2020-11-26 |
Genre | : Technology & Engineering |
ISBN | : 1000146782 |
This book addresses the needs of electronic design engineers, reliability engineers, and their respective managers, stressing a pragmatic viewpoint rather than a vigorous mathematical presentation.
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Total Pages | : 63 |
Release | : 1989 |
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MIL-HDBK-338, entitled 'Electronic Reliability Design Handbook ' is a very comprehensive handbook for use by design engineers, reliability engineers and managers to design, produce and deploy reliable and maintainable electronic systems. The handbook itself contains no subject index and can therefore be very awkward to use. The intent of this subject index is to provide a means by which specific topics and subjects can be located within the handbook. Next to each index term is the volume and page that the topic appears on. Keywords: Reliability electronics/handbooks; Electronic equipment/indexes.
Author | : Rudolph Frederick Stapelberg |
Publisher | : Springer Science & Business Media |
Total Pages | : 842 |
Release | : 2009-02-17 |
Genre | : Technology & Engineering |
ISBN | : 1848001754 |
This handbook studies the combination of various methods of designing for reliability, availability, maintainability and safety, as well as the latest techniques in probability and possibility modeling, mathematical algorithmic modeling, evolutionary algorithmic modeling, symbolic logic modeling, artificial intelligence modeling and object-oriented computer modeling.
Author | : Osamu Ueda |
Publisher | : Springer Science & Business Media |
Total Pages | : 618 |
Release | : 2012-09-24 |
Genre | : Technology & Engineering |
ISBN | : 1461443369 |
Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices. These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Lifetime predictions for compound semiconductor devices are notoriously inaccurate due to the absence of standard protocols. Manufacturers have relied on extrapolation back to room temperature of accelerated testing at elevated temperature. This technique fails for scaled, high current density devices. Device failure is driven by electric field or current mechanisms or low activation energy processes that are masked by other mechanisms at high temperature. The Handbook addresses reliability engineering for III-V devices, including materials and electrical characterization, reliability testing, and electronic characterization. These are used to develop new simulation technologies for device operation and reliability, which allow accurate prediction of reliability as well as the design specifically for improved reliability. The Handbook emphasizes physical mechanisms rather than an electrical definition of reliability. Accelerated aging is useful only if the failure mechanism is known. The Handbook also focuses on voltage and current acceleration stress mechanisms.