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Electronic Excitations in Lanthanum Cuprates Measured by Resonant Inelastic X-ray Scattering

Electronic Excitations in Lanthanum Cuprates Measured by Resonant Inelastic X-ray Scattering
Author: David Shai Ellis
Publisher:
Total Pages: 354
Release: 2010
Genre:
ISBN: 9780494677124

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Excitations of the valence electrons in the high-temperature superconducting cuprate La2--xSr xCuO4 were measured by Resonant Inelastic X-ray Scattering (RIXS). Several types of electronic excitations resonant at the Cu 1s→4p transition were studied over a wide range of dopings 0 ≤ x ≤ 0.35.A 500 meV excitation was observed at a reduced momentum transfer q=(pi 0) corresponding to the zone boundary, whose temperature and doping dependence was the same as the two-magnon Raman scattering mode. The momentum dependence of this 2-magnon excitation agrees with recent theoretical calculations.Momentum resolved measurements of the x=0 sample revealed a broad range of excitations above and below the main charge transfer peak, and their dispersions were measured across the Brillouin zone. These include a dispersionless ∼1.8 eV peak, which is either a local crystal field ( d-d excitation) or dipole-forbidden charge transfer excitation, and a dispersive 2.2 eV peak identified as a Zhang-Ng type charge-transfer exciton. The 2.2 eV peak was less dispersive than predicted from the theoretical models, due to electron-phonon coupling, as illustrated by the temperature dependent shift in the peak position.With increased hole doping, the RIXS spectral weight transfers from higher to lower energies, analogous to earlier optical conductivity studies. At the finite momentum of q=(pi 0), however, the changes are most systematic: an isosbestic point was observed at 2.2 eV where the spectra of all dopings cross, and spectral weight is transferred from high to low energies, with near-linear dependence on x, in a manner suggesting that the integrated RIXS intensity is preserved. The intensity and energy variations of the spectral peaks, as well as the isosbestic point and possible sum rule, could be explained qualitatively by a rigid three-band model which includes the non-bonding oxygen, upper Hubbard, and Zhang-Rice singlet bands. The estimated properties of the bands, such as width and energy separation, are in reasonably quantitative agreement with current theoretical models and angle-resolved photoemission measurements. Moreover, anomalies in the doping dependence are similar to those observed in other types of spectroscopies. These results underscore the relevance of the RIXS method in understanding the electronic behavior of the Lanthanum cuprates.


Electronic Excitations in Lanthanum Cuprates Measured by Resonant Inelastic X-ray Scattering

Electronic Excitations in Lanthanum Cuprates Measured by Resonant Inelastic X-ray Scattering
Author: David Shai Ellis
Publisher:
Total Pages: 0
Release: 2010
Genre:
ISBN: 9780494677124

Download Electronic Excitations in Lanthanum Cuprates Measured by Resonant Inelastic X-ray Scattering Book in PDF, ePub and Kindle

Excitations of the valence electrons in the high-temperature superconducting cuprate La2--xSr xCuO4 were measured by Resonant Inelastic X-ray Scattering (RIXS). Several types of electronic excitations resonant at the Cu 1s & rarr;4p transition were studied over a wide range of dopings 0 & le; x & le; 0.35.A 500 meV excitation was observed at a reduced momentum transfer q=(pi 0) corresponding to the zone boundary, whose temperature and doping dependence was the same as the two-magnon Raman scattering mode. The momentum dependence of this 2-magnon excitation agrees with recent theoretical calculations. Momentum resolved measurements of the x=0 sample revealed a broad range of excitations above and below the main charge transfer peak, and their dispersions were measured across the Brillouin zone. These include a dispersionless & sim;1.8 eV peak, which is either a local crystal field (d-d excitation) or dipole-forbidden charge transfer excitation, and a dispersive 2.2 eV peak identified as a Zhang-Ng type charge-transfer exciton. The 2.2 eV peak was less dispersive than predicted from the theoretical models, due to electron-phonon coupling, as illustrated by the temperature dependent shift in the peak position. With increased hole doping, the RIXS spectral weight transfers from higher to lower energies, analogous to earlier optical conductivity studies. At the finite momentum of q=(pi 0), however, the changes are most systematic: an isosbestic point was observed at 2.2 eV where the spectra of all dopings cross, and spectral weight is transferred from high to low energies, with near-linear dependence on x, in a manner suggesting that the integrated RIXS intensity is preserved. The intensity and energy variations of the spectral peaks, as well as the isosbestic point and possible sum rule, could be explained qualitatively by a rigid three-band model which includes the non-bonding oxygen, upper Hubbard, and Zhang-Rice singlet bands. The estimated properties of the bands, such as width and energy separation, are in reasonably quantitative agreement with current theoretical models and angle-resolved photoemission measurements. Moreover, anomalies in the doping dependence are similar to those observed in other types of spectroscopies. These results underscore the relevance of the RIXS method in understanding the electronic behavior of the Lanthanum cuprates.


Bibliography

Bibliography
Author: Pierre Villars
Publisher: Walter de Gruyter
Total Pages: 1827
Release: 2012-12-21
Genre: Science
ISBN: 3110276658

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By browsing about 10 000 000 scientific articles of over 200 major journals mainly in a 'cover to cover approach' some 200 000 publications were selected. The extracted data is part of the following fundamental material research fields: crystal structures (S), phase diagrams (also called constitution) (C) and the comprehensive field of intrinsic physical properties (P). This work has been done systematically starting with the literature going back to 1900. The above mentioned research field codes (S, C, P) as well as the chemical systems investigated in each publication were included in the present work. The aim of the Inorganic Substances Bibliography is to provide researchers with a comprehensive compilation of all up to now published scientific publications on inorganic systems in only three handy volumes.


Hubbard Operators in the Theory of Strongly Correlated Electrons

Hubbard Operators in the Theory of Strongly Correlated Electrons
Author: S. G. Ovchinnikov
Publisher: Imperial College Press
Total Pages: 268
Release: 2004
Genre: Science
ISBN: 9781860945977

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This book provides the first systematic discourse on a very peculiarapproach to the theory of strongly correlated systems. HubbardX-operators have been known for a long time but have not been widelyused because of their awkward algebra. The book shows that it ispossible to deal with X-operators even in the general multilevel localeigenstate system, and not just in the case of the nondegenerateHubbard model. X-operators provide the natural language for describingquasiparticles in the Hubbard subbands with unusual doping andtemperature-dependent band structures.


Chemical Abstracts

Chemical Abstracts
Author:
Publisher:
Total Pages: 2616
Release: 2002
Genre: Chemistry
ISBN:

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Core Level Spectroscopy of Solids

Core Level Spectroscopy of Solids
Author: Frank de Groot
Publisher: CRC Press
Total Pages: 512
Release: 2008-03-10
Genre: Science
ISBN: 1420008420

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Core level spectroscopy has become a powerful tool in the study of electronic states in solids. From fundamental aspects to the most recent developments, Core Level Spectroscopy of Solids presents the theoretical calculations, experimental data, and underlying physics of x-ray photoemission spectroscopy (XPS), x-ray absorption spectroscopy (XAS), x


Spectroscopy of Complex Oxide Interfaces

Spectroscopy of Complex Oxide Interfaces
Author: Claudia Cancellieri
Publisher: Springer
Total Pages: 326
Release: 2018-04-09
Genre: Technology & Engineering
ISBN: 3319749897

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This book summarizes the most recent and compelling experimental results for complex oxide interfaces. The results of this book were obtained with the cutting-edge photoemission technique at highest energy resolution. Due to their fascinating properties for new-generation electronic devices and the challenge of investigating buried regions, the book chiefly focuses on complex oxide interfaces. The crucial feature of exploring buried interfaces is the use of soft X-ray angle-resolved photoemission spectroscopy (ARPES) operating on the energy range of a few hundred eV to increase the photoelectron mean free path, enabling the photons to penetrate through the top layers – in contrast to conventional ultraviolet (UV)-ARPES techniques. The results presented here, achieved by different research groups around the world, are summarized in a clearly structured way and discussed in comparison with other photoemission spectroscopy techniques and other oxide materials. They are complemented and supported by the most recent theoretical calculations as well as results of complementary experimental techniques including electron transport and inelastic resonant X-ray scattering.