Electron And Phonon Spectrometrics PDF Download

The generation and propagation of pulses of nonequilibrium acoustic phonons and their interaction with semiconductor nanostructures are investigated. Such studies can give unique information about the properties of low-dimensional electron systems, but in order to interpret the experiments and to understand the underlying physics, a comparison with theoretical models is absolutely necessary. A central point of this work is therefore a universal theoretical approach allowing the simulation and the analysis of phonon spectroscopy measurements on low-dimensional semiconductor structures. The model takes into account the characteristic properties of the considered systems. These properties are the elastic anisotropy of the substrate material leading to focusing effects and highly anisotropic phonon propagation, the anisotropic nature of the different electron-phonon coupling mechanisms, which depend manifestly on phonon wavevector direction and polarization vector, and the sensitivity to the confinement parameters of the low-dimensional electron systems. We show that screening of the electron-phonon interaction can have a much stronger influence on the results of angle-resolved phonon spectroscopy than expected from transport measurements. Since we compare theoretical simulations with real experiments, the geometrical arrangement and the spatial extension of phonon source and detector are also included in the approach enabling a quantitative analysis of the data this way. To illustrate the influence of acoustic anisotropy and carrier confinement on the results of phonon spectroscopy in detail we analyse two different applications. In the first case the low-dimensional electron system acts as the phonon detector and the phonon induced drag current is measured. Our theoretical model enables us to calculate the electric current induced in low-dimensional electron systems by pulses of (ballistic) nonequilibrium phonons. The theoretical drag patterns reproduce the main featu.