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Effective and Efficient Optics Inspection Approach Using Machine Learning Algorithms

Effective and Efficient Optics Inspection Approach Using Machine Learning Algorithms
Author:
Publisher:
Total Pages: 9
Release: 2010
Genre:
ISBN:

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The Final Optics Damage Inspection (FODI) system automatically acquires and utilizes the Optics Inspection (OI) system to analyze images of the final optics at the National Ignition Facility (NIF). During each inspection cycle up to 1000 images acquired by FODI are examined by OI to identify and track damage sites on the optics. The process of tracking growing damage sites on the surface of an optic can be made more effective by identifying and removing signals associated with debris or reflections. The manual process to filter these false sites is daunting and time consuming. In this paper we discuss the use of machine learning tools and data mining techniques to help with this task. We describe the process to prepare a data set that can be used for training and identifying hardware reflections in the image data. In order to collect training data, the images are first automatically acquired and analyzed with existing software and then relevant features such as spatial, physical and luminosity measures are extracted for each site. A subset of these sites is 'truthed' or manually assigned a class to create training data. A supervised classification algorithm is used to test if the features can predict the class membership of new sites. A suite of self-configuring machine learning tools called 'Avatar Tools' is applied to classify all sites. To verify, we used 10-fold cross correlation and found the accuracy was above 99%. This substantially reduces the number of false alarms that would otherwise be sent for more extensive investigation.


Pattern Recognition and Computer Vision

Pattern Recognition and Computer Vision
Author: Jian-Huang Lai
Publisher: Springer
Total Pages: 589
Release: 2018-11-01
Genre: Computers
ISBN: 3030033988

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The four-volume set LNCS 11056, 110257, 11258, and 11073 constitutes the refereed proceedings of the First Chinese Conference on Pattern Recognition and Computer Vision, PRCV 2018, held in Guangzhou, China, in November 2018. The 179 revised full papers presented were carefully reviewed and selected from 399 submissions. The papers have been organized in the following topical sections: Part I: Biometrics, Computer Vision Application. Part II: Deep Learning. Part III: Document Analysis, Face Recognition and Analysis, Feature Extraction and Selection, Machine Learning. Part IV: Object Detection and Tracking, Performance Evaluation and Database, Remote Sensing.


Machine Vision Inspection Systems, Machine Learning-Based Approaches

Machine Vision Inspection Systems, Machine Learning-Based Approaches
Author: Muthukumaran Malarvel
Publisher: John Wiley & Sons
Total Pages: 352
Release: 2021-01-15
Genre: Computers
ISBN: 1119786118

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Machine Vision Inspection Systems (MVIS) is a multidisciplinary research field that emphasizes image processing, machine vision and, pattern recognition for industrial applications. Inspection techniques are generally used in destructive and non-destructive evaluation industry. Now a day's the current research on machine inspection gained more popularity among various researchers, because the manual assessment of the inspection may fail and turn into false assessment due to a large number of examining while inspection process. This volume 2 covers machine learning-based approaches in MVIS applications and it can be employed to a wide diversity of problems particularly in Non-Destructive testing (NDT), presence/absence detection, defect/fault detection (weld, textile, tiles, wood, etc.), automated vision test & measurement, pattern matching, optical character recognition & verification (OCR/OCV), natural language processing, medical diagnosis, etc. This edited book is designed to address various aspects of recent methodologies, concepts, and research plan out to the readers for giving more depth insights for perusing research on machine vision using machine learning-based approaches.


Integrated Imaging and Vision Techniques for Industrial Inspection

Integrated Imaging and Vision Techniques for Industrial Inspection
Author: Zheng Liu
Publisher: Springer
Total Pages: 541
Release: 2015-09-24
Genre: Computers
ISBN: 1447167414

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This pioneering text/reference presents a detailed focus on the use of machine vision techniques in industrial inspection applications. An internationally renowned selection of experts provide insights on a range of inspection tasks, drawn from their cutting-edge work in academia and industry, covering practical issues of vision system integration for real-world applications. Topics and features: presents a comprehensive review of state-of-the-art hardware and software tools for machine vision, and the evolution of algorithms for industrial inspection; includes in-depth descriptions of advanced inspection methodologies and machine vision technologies for specific needs; discusses the latest developments and future trends in imaging and vision techniques for industrial inspection tasks; provides a focus on imaging and vision system integration, implementation, and optimization; describes the pitfalls and barriers to developing successful inspection systems for smooth and efficient manufacturing process.


Application of Machine Learning to Optical Sensing and Imaging

Application of Machine Learning to Optical Sensing and Imaging
Author: Chen Zhou
Publisher:
Total Pages: 0
Release: 2023
Genre:
ISBN:

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Recent years have witnessed significant advancements in optical sensing and imaging techniques. To effectively interpret complex data acquired through these techniques and accurately extract information from detectors, machine learning has emerged as a promising solution. Machine learning enables automatic learning of the relationship between raw data and desired outputs, without the need for complete and explicit physics-based models. This data-driven approach presents opportunities for making inferences on material properties, solving inverse problems in the area of optical sensing and imaging. However, the current majority of machine learning methods applied in optical systems primarily serve as post-processing tools to enhance automation and improve the signal-to-noise ratio after data acquisition with standard optical systems. This approach often utilizes precision optics that can be bulky and expensive, along with typical machine learning algorithms that may not fully exploit the underlying physics. The separation of optics and algorithms in design and optimization limits the potential for integration and performance improvement. Consequently, an area of fruitful research lies in deeply integrating machine learning into the design of efficient optical hardware systems, optimizing and streamlining their performance. This dissertation aims to demonstrate how machine learning can contribute to the design of cost-effective and portable optical devices by leveraging minimal optical components in conjunction with powerful learning models. The proposed approach adopts a holistic perspective in designing optical sensing systems. By relieving the burden on optics, simpler and more affordable optical components can be utilized. Moreover, optical domain knowledge can be effectively employed to custom design efficient machine learning algorithms. The dissertation is divided into three main parts, exploring different spaces: spectral, polarization, spatial-temporal, and more. Each part focuses on enhancing and improving optical system design through the application of machine learning techniques. The first part investigates label-free bio-imaging, specifically addressing the urgent need for rapid bacterial diagnostics. Traditional gold-standard methods for bacterial diagnostics are often time-consuming, leading to delays in prescribing appropriate treatments for antimicrobial resistance. To accelerate antibacterial susceptibility testing (AST), dynamic laser speckle imaging methods are introduced in Chapter 2. Speckle images are captured, and a machine learning model is employed to track and analyze the dynamic patterns of bacteria, predicting the minimum inhibitory concentration (MIC) within a significantly reduced time frame of one hour. Furthermore, Chapter 3 proposes matched and Principal Component Analysis (PCA) Raman as a potential means to reduce the time required for bacterial identification. It demonstrates the enhancement of Raman scattering through the modulation of the excitation laser and the customization of spectral filters. Machine learning methods guide the hardware-level design of these filters to optimize efficiency and selectivity. Raman sensing is showed for classifying bacteria samples, potentially aiding in rapid bacterial identification in solution. Raman imaging is also demonstrated through the scanning of polystyrene spheres and yeast samples. The second part of the dissertation explores the application of deep learning as a data-driven method to solve inverse problems and enable real-time imaging. Chapter 4 presents a deep learning-based non-line-of-sight (NLOS) imaging system developed to reconstruct occluded objects from scattering surfaces. The system can be trained using only handwritten digits, yet it exhibits the capability to reconstruct patterns beyond the training set, including physical objects and real-time cartoon videos. By utilizing an ordinary camera and incoherent light source, this approach enables a cost-effective and real-time NLOS imaging system without the need for an explicit physical model of light transport. Deep learning is further applied to multidimensional imaging in Chapter 5, where intensity, polarization, and spectrum can be measured. In non-line-of-sight scenarios, where direct access to the object is unavailable, the scattering surface provides the only scrambled information. Conversely, in hyperspectral polarimetric imaging, direct access to the object allows for the artificial design of metasurfaces to encode light field information. By capturing images with a normal camera, encoded by a metasurface sensitive to spectral and polarization properties, the deep learning model accurately reconstructs spectral and polarization parameters for both laser and white light illumination. Demonstrations include the reconstruction of real objects, with video-rate reconstruction at over 10 frames per second. The third part of the dissertation takes a step further and explores the role of machine learning in ultrafast imaging at trillions frame per second. Chapter 6 introduces collinear frequency-resolved optical gating (FROG) for ultrafast optical pulse reconstruction. Machine learning methods are leveraged to achieve pulse retrieval at the femtosecond level, performing over 200 reconstructions per second, compared to the minutes required by traditional iterative algorithms. This advancement potentially enables high-speed imaging in nanostructures. The machine learning model is trained using simulation data that incorporates noise to replicate experimental conditions. Results demonstrate the model's ability to accurately reconstruct both simulated and experimental pulses with high precision. Additionally, Chapter 7 presents a theoretical study on ultrafast imaging with spatiotemporal mask and deep learning. Ultrafast events are encoded by spatiotemporal mask and detected using a normal camera. A deep learning model is designed to reconstruct ultrafast event sequences that are as close as 200 fs apart, utilizing single-shot images. In conclusion, this dissertation highlights the potential of machine learning to optimize optical hardware systems for various applications, including label-free bio-imaging, real-time imaging, and ultrafast imaging. By integrating machine learning techniques into optical design, cost-effective and portable devices can be developed, ushering in advancements in optical sensing and imaging technologies.


Optical Inspection of Microsystems, Second Edition

Optical Inspection of Microsystems, Second Edition
Author: Wolfgang Osten
Publisher: CRC Press
Total Pages: 656
Release: 2019-06-21
Genre: Technology & Engineering
ISBN: 0429532652

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Where conventional testing and inspection techniques fail at the microscale, optical techniques provide a fast, robust, noninvasive, and relatively inexpensive alternative for investigating the properties and quality of microsystems. Speed, reliability, and cost are critical factors in the continued scale-up of microsystems technology across many industries, and optical techniques are in a unique position to satisfy modern commercial and industrial demands. Optical Inspection of Microsystems, Second Edition, extends and updates the first comprehensive survey of the most important optical measurement techniques to be successfully used for the inspection of microsystems. Under the guidance of accomplished researcher Wolfgang Osten, expert contributors from industrial and academic institutions around the world share their expertise and experience with techniques such as image processing, image correlation, light scattering, scanning probe microscopy, confocal microscopy, fringe projection, grid and moire techniques, interference microscopy, laser-Doppler vibrometry, digital holography, speckle metrology, spectroscopy, and sensor fusion technologies. They also examine modern approaches to data acquisition and processing, such as the determination of surface features and the estimation of uncertainty of measurement results. The book emphasizes the evaluation of various system properties and considers encapsulated components to increase quality and reliability. Numerous practical examples and illustrations of optical testing reinforce the concepts. Supplying effective tools for increased quality and reliability, this book Provides a comprehensive, up-to-date overview of optical techniques for the measurement and inspection of microsystems Discusses image correlation, displacement and strain measurement, electro-optic holography, and speckle metrology techniques Offers numerous practical examples and illustrations Includes calibration of optical measurement systems for the inspection of MEMS Presents the characterization of dynamics of MEMS


Methods, Algorithms and Circuits for Photovoltaic Systems Diagnosis and Control

Methods, Algorithms and Circuits for Photovoltaic Systems Diagnosis and Control
Author: Giovanni Spagnuolo
Publisher: MDPI
Total Pages: 106
Release: 2021-04-29
Genre: Technology & Engineering
ISBN: 3036505407

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In modern photovoltaic systems, there is an ever-increasing need to improve the system efficiency, to detect internal faults and to guarantee service continuity. The only way to meet these objectives is to utilize and create synergies between diagnostic techniques and control algorithms. Diagnostic methods can be implemented through module-dedicated electronics, by running on real-time embedded systems or by using a huge database on the cloud, profiting from artificial intelligence, machine learning, and classifiers. Model-based diagnostic approaches and data-driven methods are attracting the interest of the scientific community for the automatic detection of phenomena like the occurrence of hot spots, the increase of the ohmic losses, the degradation due to unexpected potentials (PID), switch failures in power electronic converters, and also the reduction of the power production due to soiling or partial shadowing. The detection of malfunctioning or even faults affecting the whole power conversion chain, from the photovoltaic modules to the power conversion stages, allows to perform proper control actions, also in terms of MPPT. Control algorithms, running on an embedded system, are optimized, e.g., through the online adaptation of their own parameters, by suitably processing data coming from the diagnostic algorithms. This book presents recent and original results about the diagnostic approaches to photovoltaic modules and related power electronics and control strategies with the aim to maximize the photovoltaic output power, to increase the whole system efficiency and to guarantee service continuity.


ISTFA 2019: Proceedings of the 45th International Symposium for Testing and Failure Analysis

ISTFA 2019: Proceedings of the 45th International Symposium for Testing and Failure Analysis
Author:
Publisher: ASM International
Total Pages: 540
Release: 2019-12-01
Genre: Technology & Engineering
ISBN: 1627082735

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The theme for the 2019 conference is Novel Computing Architectures. Papers will include discussions on the advent of Artificial Intelligence and the promise of quantum computing that are driving disruptive computing architectures; Neuromorphic chip designs on one hand, and Quantum Bits on the other, still in R&D, will introduce new computing circuitry and memory elements, novel materials, and different test methodologies. These novel computing architectures will require further innovation which is best achieved through a collaborative Failure Analysis community composed of chip manufacturers, tool vendors, and universities.


Artificial Intelligence-of-Things (AIoT) in Precision Agriculture

Artificial Intelligence-of-Things (AIoT) in Precision Agriculture
Author: Yaqoob Majeed
Publisher: Frontiers Media SA
Total Pages: 206
Release: 2024-02-12
Genre: Science
ISBN: 2832544312

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The merging of Artificial Intelligence (AI) and Internet-of-Things is known as Artificial Intelligence-of-Things (AIoT). IoT consists of interlinked computing devices and machines which can acquire, transfer, and execute field/industrial operations without human involvement, while AI processes the acquired data and helps extract the required information. The technologies work in synergy: AI enriches IoT through machine learning and deep learning-based data analysis and learning capabilities, whereas IoT enriches AI through data acquisition, connectivity, and data exchange. Precision agriculture is becoming critically important for sustainable food production to meet the growing food demand. In recent decades, AI and IoT techniques have played an increasing role within industrial operations (e.g. autonomous manufacturing, automated supply chain management, predictive maintenance, smart energy grids, smart home appliances, and wearables), however, agricultural field operations are still heavily dependent on human labor. This is because these operations are ill-defined, unstructured, and susceptible to variation in natural conditions (e.g. illumination, landscape, atmosphere) plus the biological nature of crops (fruits, stems, leaves, and/or shoots continuously change their shape and/or color as they grow).


Proceedings of the International Conference on Computer Vision, High Performance Computing, Smart Devices and Networks

Proceedings of the International Conference on Computer Vision, High Performance Computing, Smart Devices and Networks
Author: Ch Satyanarayana
Publisher: Springer Nature
Total Pages: 208
Release: 2022-11-09
Genre: Technology & Engineering
ISBN: 9811940444

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This book consists of selected peer-reviewed articles from the International Conference on Computer Vision, High Performance Computing, Smart Devices and Networks (CHSN-2020), held at JNTU, Kakinada, India. The theme and areas of the conference include vast scope for latest concepts and trends in communication engineering, information theory and networks, signal, image and speech processing, wireless and mobile communication, Internet of Things, and cybersecurity for societal causes and humanitarian applications. ​