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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching

Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Author: Gerd Kaupp
Publisher: Springer Science & Business Media
Total Pages: 302
Release: 2006-10-24
Genre: Technology & Engineering
ISBN: 3540284729

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Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples.


Atomic Force Microscopy for Energy Research

Atomic Force Microscopy for Energy Research
Author: Cai Shen
Publisher: Emerging Materials and Technologies
Total Pages: 441
Release: 2022
Genre: Atomic force microscopy
ISBN: 9781032004075

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Atomic force microscopy (AFM) has become an important tool for materials research. In this book, the basic principles of functional AFMs and their applications in energy materials such as lithium batteries, electrochemical catalysis, solar cells, and other energy-related materials are addressed.


Scanning Force Microscopy

Scanning Force Microscopy
Author: Dror Sarid
Publisher: Oxford University Press, USA
Total Pages: 284
Release: 1994
Genre: Scanning force microscopy
ISBN: 019509204X

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This edition updates the survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in STM and a thoroughly revised bibliography.


Atomic Force Microscopy/Scanning Tunneling Microscopy 2

Atomic Force Microscopy/Scanning Tunneling Microscopy 2
Author: Samuel H. Cohen
Publisher: Springer Science & Business Media
Total Pages: 264
Release: 1997-04-30
Genre: Science
ISBN: 9780306455964

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Proceedings of the Second Symposium held in Natick, Massachusetts, June7-9, 1994


Nano-optics and Near-field Optical Microscopy

Nano-optics and Near-field Optical Microscopy
Author: Anatoly V. Zayats
Publisher: Artech House
Total Pages: 379
Release: 2009
Genre: Science
ISBN: 1596932848

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"This groundbreaking book focuses on near-field microscopy which has opened up optical processes at the nanoscale for direct inspection. Further, it explores the emerging area of nano-optics which promises to make possible optical microscopy with true nanometer resolution. This frontline resource helps you achieve high resolution optical imaging of biological species and functional materials. You also find guidance in the imaging of optical device operation and new nanophotonics functionalities"--EBL.


Near-field Nano/Atom Optics and Technology

Near-field Nano/Atom Optics and Technology
Author: Motoichi Ohtsu
Publisher: Springer Science & Business Media
Total Pages: 309
Release: 2012-12-06
Genre: Science
ISBN: 4431679375

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Intrinsic features of the optical near field open a new frontier in optical science and technology by finally overcoming the diffraction limit to reach nanometric dimensions. But this book goes beyond near-field optical microscopy to cover local spectroscopy, nanoscale optical processing and storage, quantum near-field optics, and atom manipulation. Near-Field Nano/Atom Optics and Technology provides the first complete and systematically compiled account of the science and technology required to generate the near field, and features applications including imaging of biological specimens and diagnostics for semiconductor nanomaterials and devices. This monograph will be invaluable to researchers who want to implement near-field technology in their own work, and it can also be used as a textbook for graduate or undergraduate students.


Noncontact Atomic Force Microscopy

Noncontact Atomic Force Microscopy
Author: S. Morita
Publisher: Springer Science & Business Media
Total Pages: 448
Release: 2012-12-06
Genre: Technology & Engineering
ISBN: 3642560199

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Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.


Atomic Force Microscopy/Scanning Tunneling Microscopy 3

Atomic Force Microscopy/Scanning Tunneling Microscopy 3
Author: Samuel H. Cohen
Publisher: Springer Science & Business Media
Total Pages: 208
Release: 1999-12-31
Genre: Science
ISBN: 0306462974

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This proceedings is based on the third Atomic Force Microscopy/Scanning Tunneling Microscopy symposium. The purpose of the meeting was to provide an interface between scientists, engineers, representatives of industry, government, and academia, all of whom have a common interest in probe microscopies. The papers have been written by experts in probe microscopy from around the world, representing a wide range of disciplines, including physics, biotechnology, nanotechnology, chemistry, and materials science.


Atomic Force Microscopy

Atomic Force Microscopy
Author: Peter Eaton
Publisher: Oxford University Press
Total Pages: 257
Release: 2010-03-25
Genre: Science
ISBN: 0199570450

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Atomic force microscopes are very important tools for the advancement of science and technology. This book provides an introduction to the microscopes so that scientists and engineers can learn both how to use them, and what they can do.


Noncontact Atomic Force Microscopy

Noncontact Atomic Force Microscopy
Author: Seizo Morita
Publisher: Springer
Total Pages: 539
Release: 2015-05-18
Genre: Science
ISBN: 3319155881

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This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology.