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Advanced Techniques for Materials Characterization

Advanced Techniques for Materials Characterization
Author: A.K. Tyagi
Publisher: Trans Tech Publications Ltd
Total Pages: 528
Release: 2009-01-02
Genre: Technology & Engineering
ISBN: 303813323X

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Volume is indexed by Thomson Reuters BCI (WoS). Nowadays, an impressively large number of powerful characterization techniques is being used by physicists, chemists, biologists and engineers in order to solve analytical research problems; especially those related to the investigation of the properties of new materials for advanced applications. Although there are a few available books which deal with such experimental techniques, they are either too exhaustive and cover very few techniques or are too elementary to provide a solid basis for learning to use the characterization technique. Moreover, such books usually over-emphasize the textbook approach: being full of theoretical concepts and mathematical derivations, and omitting the practical instruction required in order to permit newcomers to use the techniques.


Materials Characterization

Materials Characterization
Author: Yang Leng
Publisher: John Wiley & Sons
Total Pages: 384
Release: 2009-03-04
Genre: Technology & Engineering
ISBN: 0470822996

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This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.


Materials Characterization Techniques

Materials Characterization Techniques
Author: Sam Zhang
Publisher: CRC Press
Total Pages: 344
Release: 2008-12-22
Genre: Science
ISBN: 1420042955

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Experts must be able to analyze and distinguish all materials, or combinations of materials, in use today-whether they be metals, ceramics, polymers, semiconductors, or composites. To understand a material's structure, how that structure determines its properties, and how that material will subsequently work in technological applications, researche


Handbook of Materials Characterization

Handbook of Materials Characterization
Author: Surender Kumar Sharma
Publisher: Springer
Total Pages: 613
Release: 2018-09-18
Genre: Technology & Engineering
ISBN: 3319929550

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This book focuses on the widely used experimental techniques available for the structural, morphological, and spectroscopic characterization of materials. Recent developments in a wide range of experimental techniques and their application to the quantification of materials properties are an essential side of this book. Moreover, it provides concise but thorough coverage of the practical and theoretical aspects of the analytical techniques used to characterize a wide variety of functional nanomaterials. The book provides an overview of widely used characterization techniques for a broad audience: from beginners and graduate students, to advanced specialists in both academia and industry.


Advanced Characterization Techniques for Thin Film Solar Cells

Advanced Characterization Techniques for Thin Film Solar Cells
Author: Daniel Abou-Ras
Publisher: John Wiley & Sons
Total Pages: 760
Release: 2016-07-13
Genre: Science
ISBN: 3527699015

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The book focuses on advanced characterization methods for thin-film solar cells that have proven their relevance both for academic and corporate photovoltaic research and development. After an introduction to thin-film photovoltaics, highly experienced experts report on device and materials characterization methods such as electroluminescence analysis, capacitance spectroscopy, and various microscopy methods. In the final part of the book simulation techniques are presented which are used for ab-initio calculations of relevant semiconductors and for device simulations in 1D, 2D and 3D. Building on a proven concept, this new edition also covers thermography, transient optoelectronic methods, and absorption and photocurrent spectroscopy.


Materials Characterization Using Nondestructive Evaluation (NDE) Methods

Materials Characterization Using Nondestructive Evaluation (NDE) Methods
Author: Gerhard Huebschen
Publisher: Woodhead Publishing
Total Pages: 322
Release: 2016-03-23
Genre: Technology & Engineering
ISBN: 008100057X

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Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prevent service failures. Materials Characterization Using Nondestructive Evaluation (NDE) Methods gives an overview of established and new NDT techniques for the characterization of materials, with a focus on materials used in the automotive, aerospace, power plants, and infrastructure construction industries. Each chapter focuses on a different NDT technique and indicates the potential of the method by selected examples of applications. Methods covered include scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques. The authors review both the determination of microstructure properties, including phase content and grain size, and the determination of mechanical properties, such as hardness, toughness, yield strength, texture, and residual stress. Gives an overview of established and new NDT techniques, including scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques Reviews the determination of microstructural and mechanical properties Focuses on materials used in the automotive, aerospace, power plants, and infrastructure construction industries Serves as a highly desirable resource for both long-term monitoring and short-term assessment of materials


Optical Techniques for Solid-State Materials Characterization

Optical Techniques for Solid-State Materials Characterization
Author: Rohit P. Prasankumar
Publisher: CRC Press
Total Pages: 748
Release: 2020-06-30
Genre:
ISBN: 9780367576929

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With chapters written by pioneering experts in various optical techniques, this comprehensive reference provides detailed descriptions of basic and advanced optical techniques commonly used to study materials, from the simple to the complex. It explains how to use the techniques to acquire, analyze, and interpret data for gaining insight into ma


In-situ Materials Characterization

In-situ Materials Characterization
Author: Alexander Ziegler
Publisher: Springer Science & Business Media
Total Pages: 265
Release: 2014-04-01
Genre: Science
ISBN: 3642451527

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The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical and x-ray microscopies (e.g. scanning, transmission and low-energy electron microscopy and scanning probe microscopy) or in the scattering realm with x-ray, neutron and electron diffraction.


Ultrasonic and Advanced Methods for Nondestructive Testing and Material Characterization

Ultrasonic and Advanced Methods for Nondestructive Testing and Material Characterization
Author: Chi-hau Chen
Publisher: World Scientific
Total Pages: 682
Release: 2007
Genre: Medical
ISBN: 9812704094

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Ultrasonic methods have been very popular in nondestructive testing and characterization of materials. This book deals with both industrial ultrasound and medical ultrasound. The advantages of ultrasound include flexibility, low cost, in-line operation, and providing data in both signal and image formats for further analysis. The book devotes 11 chapters to ultrasonic methods. However, ultrasonic methods can be much less effective with some applications. So the book also has 14 chapters catering to other or advanced methods for nondestructive testing or material characterization. Topics like structural health monitoring, Terahertz methods, X-ray and thermography methods are presented. Besides different sensors for nondestructive testing, the book places much emphasis on signal/image processing and pattern recognition of the signals acquired.


Advanced Characterization Of Nanostructured Materials: Probing The Structure And Dynamics With Synchrotron X-rays And Neutrons

Advanced Characterization Of Nanostructured Materials: Probing The Structure And Dynamics With Synchrotron X-rays And Neutrons
Author: Sunil K Sinha
Publisher: World Scientific
Total Pages: 430
Release: 2021-03-23
Genre: Science
ISBN: 9811231524

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Advanced Characterization of Nanostructured Materials — Probing the Structure and Dynamics with Synchrotron X-Rays and Neutrons is a collection of chapters which review the characterization of the structure and internal dynamics of a wide variety of nanostructured materials using various synchrotron X-ray and neutron scattering techniques. It is intended for graduate students and researchers who might be interested in learning about and applying these methods. The authors are well-known practitioners in their fields of research who provide detailed and authoritative accounts of how these techniques have been applied to study systems ranging from thin films and monolayers on solid surfaces and at liquid-air, liquid-liquid and solid-liquid interfaces; nanostructured composite materials; battery materials, and catalytic materials. While there have been a great many books published on nanoscience, there are relatively few that have discussed in one volume detailed synchrotron X-ray and neutron methods for advanced characterization of nanomaterials in thin films, composite materials, catalytic and battery materials and at interfaces. This book should provide an incentive and a reference for researchers in nanomaterials for using these techniques as a powerful way to characterize their samples. It should also help to popularize the use of synchrotron and neutron facilities by the nanoscience community.